DOI: 10.1016/0038-1101(73)90013-0. Use of a Schottky barrier to measure impact ionization coefficients in semiconductors

Use of a Schottky barrier to measure impact ionization coefficients in semiconductors

10.1016/0038-1101(73)90013-0

Crossref journal-article

Elsevier BV

Solid-State Electronics (78)

Bibliography

Woods, M. H., Johnson, W. C., & Lampert, M. A. (1973). Use of a Schottky barrier to measure impact ionization coefficients in semiconductors. Solid-State Electronics, 16(3), 381â394.

Authors 3

M.H. Woods (first)
W.C. Johnson (additional)
M.A. Lampert (additional)

References 33 Referenced 180

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10.1080/00207216808938119 / Int. J. Electron. by Hall (1968)
10.1016/0375-9601(67)90071-0 / Phys. Lett. by Williams (1967)
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10.1016/0038-1101(63)90009-1 / Solid-St. Electron. by Moll (1963)
10.1103/PhysRev.99.1234 / Phys. Rev. by Miller (1955)
10.1103/PhysRev.134.A761 / Phys. Rev. by Lee (1964)
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{'key': '10.1016/0038-1101(73)90013-0_BIB16', 'first-page': '434', 'volume': '21', 'author': 'Logan', 'year': '1966', 'journal-title': 'Jap. J. appl. Phys.'} / Jap. J. appl. Phys. by Logan (1966)
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Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 4:15 a.m.)
Deposited	6 years, 4 months ago (April 5, 2019, 3:32 p.m.)
Indexed	1 month, 3 weeks ago (July 7, 2025, 4:44 a.m.)
Issued	52 years, 5 months ago (March 1, 1973)
Published	52 years, 5 months ago (March 1, 1973)
Published Print	52 years, 5 months ago (March 1, 1973)

Funders 0

None

BibTeX

@article{Woods_1973, title={Use of a Schottky barrier to measure impact ionization coefficients in semiconductors}, volume={16}, ISSN={0038-1101}, url={http://dx.doi.org/10.1016/0038-1101(73)90013-0}, DOI={10.1016/0038-1101(73)90013-0}, number={3}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Woods, M.H. and Johnson, W.C. and Lampert, M.A.}, year={1973}, month=mar, pages={381–394} }

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