DOI: 10.1016/0025-5416(72)90082-1. Electromigration in Al/Cu/Al films observed by transmission electron microscopy

Electromigration in Al/Cu/Al films observed by transmission electron microscopy

10.1016/0025-5416(72)90082-1

Crossref journal-article

Elsevier BV

Materials Science and Engineering (78)

Bibliography

Horowitz, S. J., & Blech, I. A. (1972). Electromigration in Al/Cu/Al films observed by transmission electron microscopy. Materials Science and Engineering, 10, 169â174.

Authors 2

S.J Horowitz (first)
I.A Blech (additional)

References 14 Referenced 26

10.1063/1.1657425 / J. Appl. Phys. by Blech (1969)
10.1063/1.1660116 / J. Appl. Phys. by Berenbaum (1971)
10.1063/1.1754940 / Appl. Phys. Letters by Ghate (1967)
10.1063/1.1651951 / Appl. Phys. Letters by Rosenberg (1968)
10.1147/rd.144.0461 / IBM J. Res. Develop. by Ames (1970)
10.1007/BF02662722 / Met. Trans. by d'Heurle (1971)
{'key': '10.1016/0025-5416(72)90082-1_BIB7', 'series-title': 'Proc. Europhysics Conf. Atomic Transport in Solids and Liquids', 'author': 'Rosenberg', 'year': '1970'} / Proc. Europhysics Conf. Atomic Transport in Solids and Liquids by Rosenberg (1970)
10.1063/1.1653828 / Appl. Phys. Letters by Gangulee (1971)
{'key': '10.1016/0025-5416(72)90082-1_BIB9', 'author': 'Shine', 'year': '1971', 'journal-title': 'IBM J. Res. Develop.'} / IBM J. Res. Develop. by Shine (1971)
10.1016/0022-3697(61)90138-X / J. Phys. Chem. Solids by Huntington (1961)
10.1016/0022-3697(64)90112-X / J. Phys. Chem. Solids by Penney (1964)
10.1063/1.1660603 / J. Appl. Phys. by Ohring (1971)
{'key': '10.1016/0025-5416(72)90082-1_BIB13', 'series-title': 'Proc. Reliability Phys. Symp.', 'author': 'Berenbaum', 'year': '1971'} / Proc. Reliability Phys. Symp. by Berenbaum (1971)
10.1063/1.1653018 / Appl. Phys. Letters by Rosenberg (1970)

Dates

Type	When
Created	22 years, 2 months ago (June 21, 2003, 3:13 a.m.)
Deposited	6 years, 5 months ago (March 19, 2019, 8:23 a.m.)
Indexed	1 year, 1 month ago (July 10, 2024, 10:36 a.m.)
Issued	53 years, 8 months ago (Jan. 1, 1972)
Published	53 years, 8 months ago (Jan. 1, 1972)
Published Print	53 years, 8 months ago (Jan. 1, 1972)

Funders 0

None

BibTeX

@article{Horowitz_1972, title={Electromigration in Al/Cu/Al films observed by transmission electron microscopy}, volume={10}, ISSN={0025-5416}, url={http://dx.doi.org/10.1016/0025-5416(72)90082-1}, DOI={10.1016/0025-5416(72)90082-1}, journal={Materials Science and Engineering}, publisher={Elsevier BV}, author={Horowitz, S.J and Blech, I.A}, year={1972}, month=jan, pages={169–174} }

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