Crossref journal-article
Elsevier BV
Journal of Crystal Growth (78)
Bibliography

Föll, H., Gösele, U., & Kolbesen, B. O. (1981). Microdefects in silicon and their relation to point defects. Journal of Crystal Growth, 52, 907–916.

Authors 3
  1. H. Föll (first)
  2. U. Gösele (additional)
  3. B.O. Kolbesen (additional)
References 37 Referenced 37
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Dates
Type When
Created 22 years, 10 months ago (Oct. 16, 2002, 2:46 p.m.)
Deposited 6 years, 4 months ago (April 7, 2019, 6:54 p.m.)
Indexed 4 weeks, 1 day ago (Aug. 7, 2025, 4:39 p.m.)
Issued 44 years, 5 months ago (April 1, 1981)
Published 44 years, 5 months ago (April 1, 1981)
Published Print 44 years, 5 months ago (April 1, 1981)
Funders 0

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@article{F_ll_1981, title={Microdefects in silicon and their relation to point defects}, volume={52}, ISSN={0022-0248}, url={http://dx.doi.org/10.1016/0022-0248(81)90397-3}, DOI={10.1016/0022-0248(81)90397-3}, journal={Journal of Crystal Growth}, publisher={Elsevier BV}, author={Föll, H. and Gösele, U. and Kolbesen, B.O.}, year={1981}, month=apr, pages={907–916} }