DOI: 10.1007/s11837-006-0156-z. The focused-ion-beam microscope—More than a precision ion milling machine

The focused-ion-beam microscope—More than a precision ion milling machine

10.1007/s11837-006-0156-z

Crossref journal-article

Springer Science and Business Media LLC

JOM (297)

Bibliography

Li, J. (2006). The focused-ion-beam microscopeâMore than a precision ion milling machine. JOM, 58(3), 27â31.

Authors 1

Jian Li (first)

References 22 Referenced 21

M.W. Phaneuf, Micron, 30 (3) (1999), pp. 277–288. (10.1016/S0968-4328(99)00012-8) / Micron by M.W. Phaneuf (1999)
M.W. Phaneuf, Jian Li, and T. Malis, Microscopy and Microanalysis, 4 (1998), pp. 492–493. (10.1017/S1431927600022583) / Microscopy and Microanalysis by M.W. Phaneuf (1998)
Jian Li et al., Materials Science and Engineering A, 2006, in press.
Jian Li, G.S. McMahon, and M.W. Phaneuf, Proceedings of the Microscopical Society of Canada, vol. XXVIII (Lethbridge, Canada: Microscopical Society of Canada, 2001), pp. 26–27. / Proceedings of the Microscopical Society of Canada by Jian Li (2001)
L.A. Giannuzzi and F.A. Stevie, Micron, 30 (3) (1999), pp. 197–204. (10.1016/S0968-4328(99)00005-0) / Micron by L.A. Giannuzzi (1999)
R. Anderson, Microscopy and Microanalysis, 8 (2002), pp. 44–45. (10.1017/S143192760202113X) / Microscopy and Microanalysis by R. Anderson (2002)
S. Shankar, Y.W. Riddle, and M.M. Makhlouf, Metallurgical and Materials Transactions A, 34A (2003), pp. 705–707. (10.1007/s11661-003-0105-1) / Metallurgical and Materials Transactions A by S. Shankar (2003)
M.W. Phaneuf et al., “Apparatus and Method for Reducing Differential Sputter Rates”, U.S. patent 6,641,705 (issued 4 November 2003).
M.W. Phaneuf, Jian Li, and J.D. Casey Jr., Microscopy and Microanalysis, 8 (Suppl. 2) (2002), p. 52. (10.1017/S1431927602101589) / Microscopy and Microanalysis by M.W. Phaneuf (2002)
Jian Li, M. Phaneuf, and S. Saimoto, “Steps Towards Orientation Measurement in a Focused Ion Beam Microscope” (Paper presented at the Conference of Microscopical Society of Canada, Ottawa, 1998).
L.A. Giannuzzi et al., Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice, ed. L.A. Giannuzzi and F.A. Stevie (New York: Springer-Verlag, 2004), p. 201. / Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice by L.A. Giannuzzi (2004)
D.M. Longo, J.M. Howe, and W.C. Johnson, Ultramicroscopy 80 (2) (1999), pp. 69–84. (10.1016/S0304-3991(99)00081-9) / Ultramicroscopy by D.M. Longo (1999)
R. Anderson, and S.J. Klepeis, Materials Research Society Symposium Proceedings, 480 (Warrendale, PA: Materials Research Society, 1997), p. 187. / Materials Research Society Symposium Proceedings by R. Anderson (1997)
B.I. Prenitzer et al., Metallurgical and Materials Transactions A, 29A (9) (1998), pp. 2399–2406. (10.1007/s11661-998-0116-z) / Metallurgical and Materials Transactions A by B.I. Prenitzer (1998)
R.M. Langford, A.K. Petford-Long, and P. Gnauck, Microscopy and Microanalysis, 8 (Suppl. 2) (2002), pp. 46–47. (10.1017/S1431927602101553) / Microscopy and Microanalysis by R.M. Langford (2002)
P. Gasser et al., Microscopy and Microanalysis, 10 (2004), pp. 311–316. (10.1017/S1431927604040413) / Microscopy and Microanalysis by P. Gasser (2004)
R.J. Patterson et al., Microscopy and Microanalysis, 8 (2002), pp. 566–567. (10.1017/S1431927602105502) / Microscopy and Microanalysis by R.J. Patterson (2002)
Jian Li et al., Aerospace Materials and Manufacturing: Development, Testing and Life Cycle Issues, ed P.C. Patnaik et al. (Hamilton, Ontario, Canada: Metallurgical Society of CIM, 2004), pp. 515–523. / Aerospace Materials and Manufacturing: Development, Testing and Life Cycle Issues by Jian Li (2004)
M. Elboujdaini et al., “Stress Corrosion Cracking: Microstructural and Materials Properties for Crack Initiation of 16” X-52 Line Pipe Steel” (Presentation at the NACE International Conference, CORROSION/2004. Paper #04554; New Orleans, March 2004).
Jian Li, V.Y. Gertsman, and J. Lo, Microscopy and Microanalysis, 9 (Suppl. S02) (2003), pp. 888–889. / Microscopy and Microanalysis by Jian Li (2003)
J.M. Cairney, and P.R. Munroe, Materials Characterization, 46 (2001), pp. 297–304. (10.1016/S1044-5803(00)00107-8) / Materials Characterization by J.M. Cairney (2001)
Tom Malis et al. Contributions of Microscopy to Advanced Industrial Materials and Processing. Industrial Applications of Electron Microscopy, ed. Zhigang R. Li (New York: Marcel-Dekker Inc., 2002). / Contributions of Microscopy to Advanced Industrial Materials and Processing. Industrial Applications of Electron Microscopy by Tom Malis (2002)

Dates

Type	When
Created	18 years, 2 months ago (June 23, 2007, 5:31 a.m.)
Deposited	4 years ago (Aug. 15, 2021, 6:25 a.m.)
Indexed	4 months, 1 week ago (April 16, 2025, 9:27 a.m.)
Issued	19 years, 5 months ago (March 1, 2006)
Published	19 years, 5 months ago (March 1, 2006)
Published Print	19 years, 5 months ago (March 1, 2006)

Funders 0

None

BibTeX

@article{Li_2006, title={The focused-ion-beam microscope—More than a precision ion milling machine}, volume={58}, ISSN={1543-1851}, url={http://dx.doi.org/10.1007/s11837-006-0156-z}, DOI={10.1007/s11837-006-0156-z}, number={3}, journal={JOM}, publisher={Springer Science and Business Media LLC}, author={Li, Jian}, year={2006}, month=mar, pages={27–31} }

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