Crossref
journal-article
Springer Science and Business Media LLC
Journal of Electronic Materials (297)
References
16
Referenced
88
- D.P. Napp, SAMPE J. 32, 59 (1996). / SAMPE J. by D.P. Napp (1996)
-
John H. Lau, Solder Joint Reliability, (New York: Van Norstrand Reinohold, 1991), p. 572.
(
10.1007/978-1-4615-3910-0
) / Solder Joint Reliability by John H. Lau (1991) -
M. Harada and R. Satoh, IEEE Trans. Comp. Hybrids and Manuf. Technol. 13, 736 (1986).
(
10.1109/33.62587
) / IEEE Trans. Comp. Hybrids and Manuf. Technol. by M. Harada (1986) -
D.M. Jarboe, Thermal Fatigue Evaluation of Solder Alloys, Bendix Kansas City Division internal report, DBX-613-2341 (1980).
(
10.2172/5563721
) -
H.D. Solomon, Trans. ASME. J. Elec. Packaging 113, 102 (1991).
(
10.1115/1.2905374
) / Trans. ASME. J. Elec. Packaging by H.D. Solomon (1991) -
P.T. Vianco and A.C. Claghorn, Soldering & Surf. Mount Technol. 12, 12 (1996).
(
10.1108/09540919610777708
) / Soldering & Surf. Mount Technol. by P.T. Vianco (1996) -
M.E. Loomans, S. Vaynman, G. Ghosh and M.E. Fine, J. Electron. Mater. 23, 741 (1994).
(
10.1007/BF02651368
) / J. Electron. Mater. by M.E. Loomans (1994) -
U.R. Kattner and W.J. Boettinger, J. Electron. Mater. 23, 603 (1994).
(
10.1007/BF02653345
) / J. Electron. Mater. by U.R. Kattner (1994) - M. McCormack and S. Jin, J. Electron. Mater. 23, 631 (1994). / J. Electron. Mater. by M. McCormack (1994)
-
M. McCormack and S. Jin, J. Electron. Mater. 23, 715 (1994).
(
10.1007/BF02651364
) / J. Electron. Mater. by M. McCormack (1994) -
M.E. Loomans, S. Vaynman, G. Ghosh, and M.E. Fine, J. Electron. Mater. 23, 741 (1994).
(
10.1007/BF02651368
) / J. Electron. Mater. by M.E. Loomans (1994) -
H.D. Solomon, IEEE Trans. Comp. Hybrids and Manuf. Technol., CHMT9, 423 (1986).
(
10.1109/TCHMT.1986.1136672
) -
S. Vaynman, M.E. Fine and D.A. Jeannotte, Metall. Trans. A, 19A, 1051 (1988).
(
10.1007/BF02628389
) / Metall. Trans. A by S. Vaynman (1988) -
E.C. Cutiongco, S. Vaynman, M.E. Fine and D.A. Jeannotte, Trans. ASME. J. Electron. Packaging 112, 110 (1990).
(
10.1115/1.2904350
) / Trans. ASME. J. Electron. Packaging by E.C. Cutiongco (1990) -
H.D. Solomom, Trans. ASME. J. Electronic Packaging 113, 102 (1991).
(
10.1115/1.2905374
) / Trans. ASME. J. Electronic Packaging by H.D. Solomom (1991) -
D.R. Frear, JOM 48, 49 (1996).
(
10.1007/BF03222944
) / JOM by D.R. Frear (1996)
Dates
Type | When |
---|---|
Created | 18 years, 4 months ago (April 6, 2007, 3:40 a.m.) |
Deposited | 6 years, 3 months ago (June 1, 2019, 12:04 p.m.) |
Indexed | 2 months, 1 week ago (June 26, 2025, 9:34 p.m.) |
Issued | 27 years, 2 months ago (July 1, 1998) |
Published | 27 years, 2 months ago (July 1, 1998) |
Published Print | 27 years, 2 months ago (July 1, 1998) |
@article{Kariya_1998, title={Effect of bismuth on the isothermal fatigue properties of Sn-3.5mass%Ag solder alloy}, volume={27}, ISSN={1543-186X}, url={http://dx.doi.org/10.1007/s11664-998-0111-6}, DOI={10.1007/s11664-998-0111-6}, number={7}, journal={Journal of Electronic Materials}, publisher={Springer Science and Business Media LLC}, author={Kariya, Yoshiharu and Otsuka, Masahisa}, year={1998}, month=jul, pages={866–870} }