Crossref journal-article
Springer Science and Business Media LLC
Metallurgical and Materials Transactions A (297)
Bibliography

Deng, X., Sidhu, R. S., Johnson, P., & Chawla, N. (2005). Influence of reflow and thermal aging on the shear strength and fracture behavior of Sn-3.5Ag solder/Cu joints. Metallurgical and Materials Transactions A, 36(1), 55–64.

Authors 4
  1. X. Deng (first)
  2. R. S. Sidhu (additional)
  3. P. Johnson (additional)
  4. N. Chawla (additional)
References 40 Referenced 162
  1. M. Abtew and G. Selvaduray: Mater. Sci. Eng. R: Rep., 2000, vol. 27, pp. 95–141. (10.1016/S0927-796X(00)00010-3) / Mater. Sci. Eng. R: Rep. by M. Abtew (2000)
  2. E.P. Wood and K.L. Nimmo: J. Electron. Mater., 1994, vol. 23, pp. 709–13. (10.1007/BF02651363) / J. Electron. Mater. by E.P. Wood (1994)
  3. J. Glazer: J. Electron. Mater., 1994, vol. 23, pp. 693–700. (10.1007/BF02651361) / J. Electron. Mater. by J. Glazer (1994)
  4. W. Yang, L.E. Felton, and R.W. Messler: J. Electron. Mater., 1995, vol. 24, pp. 1465–72. (10.1007/BF02655465) / J. Electron. Mater. by W. Yang (1995)
  5. S. Yu, M. Hon, and M. Wang: J. Electron. Mater., 2000, vol. 29, pp. 237–43. (10.1007/s11664-000-0149-6) / J. Electron. Mater. by S. Yu (2000)
  6. H. Lee, M. Chen, H. Jao, and T. Liao: Mater. Sci. Eng. A, 2003, vol. 358, pp. 134–41. (10.1016/S0921-5093(03)00277-6) / Mater. Sci. Eng. A by H. Lee (2003)
  7. D.R. Frear: JOM, 1996, vol. 48 (5), pp. 49–53. (10.1007/BF03222944) / JOM by D.R. Frear (1996)
  8. D.R. Frear and P.T. Vianco: Metall. Trans. A, 1994, vol. 25A, pp. 1509–23. (10.1007/BF02665483) / Metall. Trans. A by D.R. Frear (1994)
  9. C.W. Hwang and K. Suganuma: Mater. Sci. Eng. A, 2004, vol. 373, pp. 187–94. (10.1016/j.msea.2004.01.019) / Mater. Sci. Eng. A by C.W. Hwang (2004)
  10. K.N. Tu and R.D. Thompson: Acta Metall., 1982, vol. 30 (5), pp. 947–52. (10.1016/0001-6160(82)90201-2) / Acta Metall. by K.N. Tu (1982)
  11. X. Deng, G. Piotrowski, J.J. Williams, and N. Chawla: J. Electron. Mater., 2003, vol. 32, pp. 1403–13. (10.1007/s11664-003-0108-0) / J. Electron. Mater. by X. Deng (2003)
  12. K.H. Prakash and T. Sritharan: Acta Mater., 2001, vol. 49, pp. 2481–89. (10.1016/S1359-6454(01)00146-X) / Acta Mater. by K.H. Prakash (2001)
  13. W.K. Choi and H.M. Lee: J. Electron. Mater., 2000, vol. 29, pp. 1207–13. (10.1007/s11664-000-0014-7) / J. Electron. Mater. by W.K. Choi (2000)
  14. F. Guo, S. Choi, J.P. Lucas, and K.N. Subramanian: J. Electron. Mater., 2000, vol. 29, pp. 1241–48. (10.1007/s11664-000-0019-2) / J. Electron. Mater. by F. Guo (2000)
  15. D. Ma, W.D. Wang, and S.K. Lahiri: J. Appl. Phys., 2002, vol. 91, pp. 3312–17. (10.1063/1.1445283) / J. Appl. Phys. by D. Ma (2002)
  16. C.R. Kao: Mater. Sci. Eng., 1997, vol. A238, pp. 196–201. (10.1016/S0921-5093(97)00449-8) / Mater. Sci. Eng. by C.R. Kao (1997)
  17. A. Hayashi, C.R. Kao, and Y.A. Chang: Scripta Mater., 1997, vol. 37, pp. 393–98. (10.1016/S1359-6462(97)00129-2) / Scripta Mater. by A. Hayashi (1997)
  18. S. Chada, R.A. Fournelle, W. Laub, and D. Shangguan: J. Electron. Mater., 2000, vol. 29, pp. 1214–21. (10.1007/s11664-000-0015-6) / J. Electron. Mater. by S. Chada (2000)
  19. Z. Mei, A.J. Sunwoo, and J.W. Morris, Jr.: Metall. Trans. A, 1992, vol. 23A, pp. 857–64. (10.1007/BF02675563) / Metall. Trans. A by Z. Mei (1992)
  20. W.K. Choi and H.M. Lee: J. Electron. Mater., 2000, vol. 29, pp. 1207–13. (10.1007/s11664-000-0014-7) / J. Electron. Mater. by W.K. Choi (2000)
  21. Y.C. Chan, A.C.K. So, and J.K.L. Lai: Mater. Sci. Eng. B, 1998, vol. 55, pp. 5–13. (10.1016/S0921-5107(98)00202-5) / Mater. Sci. Eng. B by Y.C. Chan (1998)
  22. H.L.J. Pang, K.H. Tan, X.W. Shi, and Z.P. Wang: Mater. Sci. Eng. A, 2001, vol. 307, pp. 42–50. (10.1016/S0921-5093(00)01958-4) / Mater. Sci. Eng. A by H.L.J. Pang (2001)
  23. Hui-Wei Miao and Jenq-Gong Duh: Mater. Chem. Phys., 2001, vol. 71, pp. 255–71. (10.1016/S0254-0584(01)00298-X) / Mater. Chem. Phys. by Hui-Wei Miao (2001)
  24. F. Ochoa, J.J. Williams, and N. Chawla: JOM, 2003, vol. 55 (6), pp. 56–60. (10.1007/s11837-003-0142-7) / JOM by F. Ochoa (2003)
  25. F. Ochoa, J.J. Williams, and N. Chawla: J. Electron. Mater., 2003, vol. 32, pp. 1414–20. (10.1007/s11664-003-0109-z) / J. Electron. Mater. by F. Ochoa (2003)
  26. P. Protsenko, A. Terlain, V. Traskine, and N. Eustathopoulos: Scripta Mater., 2001, vol. 45, pp. 1439–45. (10.1016/S1359-6462(01)01181-2) / Scripta Mater. by P. Protsenko (2001)
  27. R.E. Pratt, E.I. Stromswold, and D.J. Quesnel: J. Electron. Mater., 1994, vol. 23 (4), pp. 375–82. (10.1007/BF02671217) / J. Electron. Mater. by R.E. Pratt (1994)
  28. C.K. Alex and Y.C. Chan: IEEE Trans. CPMT-B, 1996, vol. 19 (3), pp. 661–68. / IEEE Trans. CPMT-B by C.K. Alex (1996)
  29. P.L. Tu, Y.C. Chan, and J.K.L. Lai: IEEE Trans. CPMT-B, 1997, vol. 20 (1), pp. 87–93. / IEEE Trans. CPMT-B by P.L. Tu (1997)
  30. W.W. Mullins: J. Appl. Phys., 1957, vol. 28, pp. 333–39. (10.1063/1.1722742) / J. Appl. Phys. by W.W. Mullins (1957)
  31. R.J. Fields and S.R. Low: http://www.metallurgy.nist.gov/mechanical_properties/solder_paper.html.
  32. Y.C. Chan, D.J. Xie, and J.K.L Lai: Mater. Sci. Eng. B, 1996, vol. 38, pp. 53–61. (10.1016/0921-5107(95)01317-2) / Mater. Sci. Eng. B by Y.C. Chan (1996)
  33. B.A. Cook, I.E. Anderson, J.L. Harringa, R.L. Terpstra, J.C. Foley, O. Unal, and F.C. Laabs: J. Electron. Mater., 2001, vol. 30, pp. 1214–21. (10.1007/s11664-001-0152-6) / J. Electron. Mater. by B.A. Cook (2001)
  34. T. Lee, J. Lee, and I. Jung: Microelectronics and Reliability, 1998, vol. 38 (12), pp. 1941–47. (10.1016/S0026-2714(98)00163-2) / Microelectronics and Reliability by T. Lee (1998)
  35. T. Reinikainen, M. Poech, M. Krumm, and J. Kivilahti: Trans. ASME, 1998, vol. 120, pp. 106–13. (10.1115/1.2826660) / Trans. ASME by T. Reinikainen (1998)
  36. E.P. Busso, M. Kitano, and T. Kumazawa: ASME J. Electron. Packaging, 1994, vol. 116, pp. 6–15. (10.1115/1.2905496) / ASME J. Electron. Packaging by E.P. Busso (1994)
  37. N. Paydar, Y. Tong, and H.U. Akay: ASME J. Electron. Packaging, 1994, vol. 116, pp. 265–73. (10.1115/1.2905697) / ASME J. Electron. Packaging by N. Paydar (1994)
  38. X. Deng: Arizona State University, Tempe, AZ, unpublished research, 2004.
  39. X. Deng, M. Koopman, N. Chawla, and K.K. Chawla: Mater. Sci. Eng., 2004, vol. 364, pp. 241–43. (10.1016/j.msea.2003.08.032) / Mater. Sci. Eng. by X. Deng (2004)
  40. X. Deng, N. Chawla, K.K. Chawla, and M. Koopman: Acta Mater., 2004, vol. 52, pp. 4291–4303. (10.1016/j.actamat.2004.05.046) / Acta Mater. by X. Deng (2004)
Dates
Type When
Created 18 years, 4 months ago (April 6, 2007, 1:56 p.m.)
Deposited 2 years, 3 months ago (May 17, 2023, 10:21 a.m.)
Indexed 1 month, 2 weeks ago (July 9, 2025, 7 p.m.)
Issued 20 years, 7 months ago (Jan. 1, 2005)
Published 20 years, 7 months ago (Jan. 1, 2005)
Published Print 20 years, 7 months ago (Jan. 1, 2005)
Funders 0

None

@article{Deng_2005, title={Influence of reflow and thermal aging on the shear strength and fracture behavior of Sn-3.5Ag solder/Cu joints}, volume={36}, ISSN={1543-1940}, url={http://dx.doi.org/10.1007/s11661-005-0138-8}, DOI={10.1007/s11661-005-0138-8}, number={1}, journal={Metallurgical and Materials Transactions A}, publisher={Springer Science and Business Media LLC}, author={Deng, X. and Sidhu, R. S. and Johnson, P. and Chawla, N.}, year={2005}, month=jan, pages={55–64} }