DOI: 10.1007/s10854-009-9898-z. Two critical grain sizes of Ba0.6Sr0.4TiO3 thin films

Two critical grain sizes of Ba0.6Sr0.4TiO3 thin films

10.1007/s10854-009-9898-z

Crossref journal-article

Springer Science and Business Media LLC

Journal of Materials Science: Materials in Electronics (297)

Bibliography

Chen, H., Yang, C., Zhang, J., Leng, W., Ji, H., Wang, Z., Liao, J., & Zhao, L. (2009). Two critical grain sizes of Ba0.6Sr0.4TiO3 thin films. Journal of Materials Science: Materials in Electronics, 21(3), 236â240.

Authors 8

Hongwei Chen (first)
Chuanren Yang (additional)
Jihua Zhang (additional)
Wenjian Leng (additional)
Hong Ji (additional)
Zhihong Wang (additional)
Jiaxuan Liao (additional)
Li Zhao (additional)

References 16 Referenced 6

H. Chen, C. Yang, C. Fu, L. Zhao, Z. Gao, Appl. Surf. Sci. 252, 4171–4177 (2006). doi: 10.1016/j.apsusc.2005.06.027 (10.1016/j.apsusc.2005.06.027) / Appl. Surf. Sci. by H Chen (2006)
T. Yu, Z.X. Shen, W.S. Toh, J.M. Xue, J. Wang, J. Appl. Phys. 94, 618 (2003). doi: 10.1063/1.1583146 (10.1063/1.1583146) / J. Appl. Phys. by T Yu (2003)
W.L. Zhong, S.T. Ai, B. Jiang, J. Inorg. Mater. 17, 1009–1012 (2002) / J. Inorg. Mater. by WL Zhong (2002)
C.J. Lu, H.M. Shen, Y.N. Wang, Mater. Lett. 34, 5–9 (1998). doi: 10.1016/S0167-577X(97)00128-6 (10.1016/S0167-577X(97)00128-6) / Mater. Lett. by CJ Lu (1998)
A. Roelofs, T. Schneller, K. Szot, R. Waser, Appl. Phys. Lett. 81, 5231–5233 (2002). doi: 10.1063/1.1534412 (10.1063/1.1534412) / Appl. Phys. Lett. by A Roelofs (2002)
Y. Drezner, S. Berger, J. Appl. Phys. 94, 6774–6778 (2003). doi: 10.1063/1.1618939 (10.1063/1.1618939) / J. Appl. Phys. by Y Drezner (2003)
A. Roelofs, N.A. Pertsev, R. Waser, F. Schlaphof, L.M. Eng, C. Ganpule, V. Nagarajan, R. Ramesh, Appl. Phys. Lett. 80, 1424–1426 (2002). doi: 10.1063/1.1448653 (10.1063/1.1448653) / Appl. Phys. Lett. by A Roelofs (2002)
H. Fan, H.E. Kim, J. Appl. Phys. 91, 317–322 (2002). doi: 10.1063/1.1421036 (10.1063/1.1421036) / J. Appl. Phys. by H Fan (2002)
Z. Kighelman, D. Damjanovic, M. Cantoni, N. Setter, J. Appl. Phys. 91, 1495–1501 (2002). doi: 10.1063/1.1431432 (10.1063/1.1431432) / J. Appl. Phys. by Z Kighelman (2002)
S. Wicks, V. Anbusathiah, V. Nagarajan, Nanotechnology 18, 465502 (2007). doi: 10.1088/0957-4484/18/46/465502 (10.1088/0957-4484/18/46/465502) / Nanotechnology by S Wicks (2007)
W.L. Zhong, Y.G. Wang, P.L. Zhang, B.D. Qu, Phys. Rev. B 50, 698–703 (1994). doi: 10.1103/PhysRevB.50.698 (10.1103/PhysRevB.50.698) / Phys. Rev. B by WL Zhong (1994)
S.Y. Kuo, W.Y. Liao, W.F. Hsieh, Phys. Rev. B 64, 224103 (2001) (10.1103/PhysRevB.64.224103) / Phys. Rev. B by SY Kuo (2001)
Y.I. Yuzyuk, P. Simon, I.N. Zakharchenko, V.A. Alyoshin, E.V. Sviridov, Phys. Rev. B 66, 052103 (2002). doi: 10.1103/PhysRevB.66.052103 (10.1103/PhysRevB.66.052103) / Phys. Rev. B by YI Yuzyuk (2002)
H. Chen, C. Yang, C. Fu, Y. Pei, L. Hu, Mater. Sci. Eng. B 121(1–2), 98–102 (2005) (10.1016/j.mseb.2005.03.008) / Mater. Sci. Eng. B by H Chen (2005)
C. Fu, C. Yang, H. Chen, L. Hu, L. Dai, Appl. Surf. Sci. 252(2), 461–465 (2005). doi: 10.1016/j.apsusc.2005.01.069 (10.1016/j.apsusc.2005.01.069) / Appl. Surf. Sci. by C Fu (2005)
B.D. Cullity, Elements of X-ray diffraction, Addison-Wesley Reading MA (1956)

Dates

Type	When
Created	16 years, 4 months ago (April 21, 2009, 9:20 p.m.)
Deposited	6 years, 3 months ago (May 30, 2019, 7:15 p.m.)
Indexed	1 year, 11 months ago (Sept. 14, 2023, 3:32 p.m.)
Issued	16 years, 4 months ago (April 23, 2009)
Published	16 years, 4 months ago (April 23, 2009)
Published Online	16 years, 4 months ago (April 23, 2009)
Published Print	15 years, 6 months ago (March 1, 2010)

Funders 0

None

BibTeX

@article{Chen_2009, title={Two critical grain sizes of Ba0.6Sr0.4TiO3 thin films}, volume={21}, ISSN={1573-482X}, url={http://dx.doi.org/10.1007/s10854-009-9898-z}, DOI={10.1007/s10854-009-9898-z}, number={3}, journal={Journal of Materials Science: Materials in Electronics}, publisher={Springer Science and Business Media LLC}, author={Chen, Hongwei and Yang, Chuanren and Zhang, Jihua and Leng, Wenjian and Ji, Hong and Wang, Zhihong and Liao, Jiaxuan and Zhao, Li}, year={2009}, month=apr, pages={236–240} }

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