DOI: 10.1007/s100510050219. Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface

Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface

10.1007/s100510050219

Crossref journal-article

Springer Science and Business Media LLC

The European Physical Journal B (297)

Bibliography

Hudlet, S., Saint Jean, M., Guthmann, C., & Berger, J. (1998). Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface. The European Physical Journal B, 2(1), 5â10.

Authors 4

S. Hudlet (first)
M. Saint Jean (additional)
C. Guthmann (additional)
J. Berger (additional)

References 0 Referenced 294

None

Dates

Type	When
Created	22 years, 11 months ago (Aug. 25, 2002, 1:25 a.m.)
Deposited	6 years, 2 months ago (May 29, 2019, 12:18 a.m.)
Indexed	2 weeks, 3 days ago (Aug. 6, 2025, 9:40 a.m.)
Issued	27 years, 4 months ago (April 1, 1998)
Published	27 years, 4 months ago (April 1, 1998)
Published Print	27 years, 4 months ago (April 1, 1998)

Funders 0

None

BibTeX

@article{Hudlet_1998, title={Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface}, volume={2}, ISSN={1434-6028}, url={http://dx.doi.org/10.1007/s100510050219}, DOI={10.1007/s100510050219}, number={1}, journal={The European Physical Journal B}, publisher={Springer Science and Business Media LLC}, author={Hudlet, S. and Saint Jean, M. and Guthmann, C. and Berger, J.}, year={1998}, month=apr, pages={5–10} }

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