DOI: 10.1007/s10008-010-1289-0. The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS

The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS

10.1007/s10008-010-1289-0

Crossref journal-article

Springer Science and Business Media LLC

Journal of Solid State Electrochemistry (297)

Bibliography

Kilner, J. A., Skinner, S. J., & Brongersma, H. H. (2011). The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS. Journal of Solid State Electrochemistry, 15(5), 861â876.

Authors 3

John A. Kilner (first)
Stephen J. Skinner (additional)
Hidde H. Brongersma (additional)

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Dates

Type	When
Created	14 years, 6 months ago (Feb. 3, 2011, 10:07 p.m.)
Deposited	5 months, 3 weeks ago (March 2, 2025, 5:43 a.m.)
Indexed	44 minutes ago (Aug. 30, 2025, midnight)
Issued	14 years, 6 months ago (Feb. 5, 2011)
Published	14 years, 6 months ago (Feb. 5, 2011)
Published Online	14 years, 6 months ago (Feb. 5, 2011)
Published Print	14 years, 3 months ago (May 1, 2011)

Funders 0

None

BibTeX

@article{Kilner_2011, title={The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS}, volume={15}, ISSN={1433-0768}, url={http://dx.doi.org/10.1007/s10008-010-1289-0}, DOI={10.1007/s10008-010-1289-0}, number={5}, journal={Journal of Solid State Electrochemistry}, publisher={Springer Science and Business Media LLC}, author={Kilner, John A. and Skinner, Stephen J. and Brongersma, Hidde H.}, year={2011}, month=feb, pages={861–876} }

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