DOI: 10.1007/s00604-007-0853-5. Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope

Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope

10.1007/s00604-007-0853-5

Crossref journal-article

Springer Science and Business Media LLC

Microchimica Acta (297)

Bibliography

Schaffer, M., & Wagner, J. (2007). Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope. Microchimica Acta, 161(3â4), 421â425.

Authors 2

Miroslava Schaffer (first)
Julian Wagner (additional)

References 20 Referenced 25

10.1007/978-1-4615-0765-9 / High resolution focused ion beams: FIB and its applications by J Orloff (2003)
10.1007/b101190 / Introduction to focused ion beams by L A Giannuzzi (2005)
10.1016/S0968-4328(99)00005-0 / Micron by L A Giannuzzi (1999)
10.1016/S0968-4328(99)00008-6 / Micron by M J Vasile (1999)
10.1016/S0968-4328(99)00012-8 / Micron by M W Phaneuf (1999)
10.1116/1.1371317 / J Vac Sci Technol by R M Langford (2001)
10.1093/jmicro/dfh063 / J Electron Microsc by T Kamino (2004)
10.1063/1.125311 / Appl Phys Lett by D N Dunn (1999)
10.1016/j.joms.2006.10.025 / J Oral Maxillofac Surg by L A Giannuzzi (2007)
10.1016/j.matchar.2006.01.019 / Mater Charact by M A Groeber (2007)
10.1111/j.0022-2720.2004.01397.x / J Microsc by L Holzer (2004)
10.1116/1.590193 / J Vac Sci Technol by Z Cheng (1998)
10.1016/S1359-6462(01)01090-9 / Scipta Mater by B J Inkson (2001)
10.1046/j.1365-2818.2001.00767.x / J Microsc by B J Inkson (2001)
10.1016/j.actamat.2005.11.015 / Acta Mater by J Konrad (2006)
10.1093/jmicro/dfh079 / J Electron Microsc by K H Park (2004)
Lifshin E, Eversten J, Principe E, Friel J (2004) Three dimensional imaging of microelectronic devices using a crossbeam FIB. Proc. of 30th Int. Symp. for testing and failure analysis, Worcester 429 (10.31399/asm.cp.istfa2004p0429)
10.1017/S1431927606060193 / Microsc Microanal by P G Kotula (2006)
{'key': '853_CR19', 'first-page': '487', 'volume': '107', 'author': 'M Schaffer', 'year': '2006', 'journal-title': 'Ultramicroscopy'} / Ultramicroscopy by M Schaffer (2006)
FEI Company (2003) xT Nova NanoLab User’s Manual 1st edn. pp 5–57

Dates

Type	When
Created	17 years, 11 months ago (Sept. 28, 2007, 5:43 a.m.)
Deposited	2 years, 3 months ago (May 14, 2023, 4:11 a.m.)
Indexed	3 months, 3 weeks ago (May 3, 2025, 3:43 p.m.)
Issued	17 years, 11 months ago (Sept. 28, 2007)
Published	17 years, 11 months ago (Sept. 28, 2007)
Published Online	17 years, 11 months ago (Sept. 28, 2007)
Published Print	17 years, 2 months ago (June 1, 2008)

Funders 0

None

BibTeX

@article{Schaffer_2007, title={Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope}, volume={161}, ISSN={1436-5073}, url={http://dx.doi.org/10.1007/s00604-007-0853-5}, DOI={10.1007/s00604-007-0853-5}, number={3–4}, journal={Microchimica Acta}, publisher={Springer Science and Business Media LLC}, author={Schaffer, Miroslava and Wagner, Julian}, year={2007}, month=sep, pages={421–425} }

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