DOI: 10.1007/s003390051136. Mapping the domain distribution at ferroelectric surfaces by scanning force microscopy

Mapping the domain distribution at ferroelectric surfaces by scanning force microscopy

10.1007/s003390051136

Crossref journal-article

Springer Science and Business Media LLC

Applied Physics A: Materials Science & Processing (297)

Bibliography

Abplanalp, M., Eng, L. M., & GÃ¼nter, P. (1998). Mapping the domain distribution at ferroelectric surfaces by scanning force microscopy. Applied Physics A: Materials Science & Processing, 66(7), S231âS234.

Authors 3

M. Abplanalp (first)
L.M. Eng (additional)
P. Günter (additional)

References 0 Referenced 131

None

Dates

Type	When
Created	23 years ago (Aug. 25, 2002, 5:25 a.m.)
Deposited	6 years, 3 months ago (May 28, 2019, 8:56 a.m.)
Indexed	1 month ago (July 24, 2025, 7:50 a.m.)
Issued	27 years, 5 months ago (March 1, 1998)
Published	27 years, 5 months ago (March 1, 1998)
Published Print	27 years, 5 months ago (March 1, 1998)

Funders 0

None

BibTeX

@article{Abplanalp_1998, title={Mapping the domain distribution at ferroelectric surfaces by scanning force microscopy}, volume={66}, ISSN={1432-0630}, url={http://dx.doi.org/10.1007/s003390051136}, DOI={10.1007/s003390051136}, number={7}, journal={Applied Physics A: Materials Science & Processing}, publisher={Springer Science and Business Media LLC}, author={Abplanalp, M. and Eng, L.M. and Günter, P.}, year={1998}, month=mar, pages={S231–S234} }

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