DOI: 10.1007/s003390050721. Review of defect investigations by means of positron annihilation in II-VI compound semiconductors

Review of defect investigations by means of positron annihilation in II-VI compound semiconductors

10.1007/s003390050721

Crossref journal-article

Springer Science and Business Media LLC

Applied Physics A: Materials Science & Processing (297)

Bibliography

Krause-Rehberg, R., Leipner, H. S., Abgarjan, T., & Polity, A. (1998). Review of defect investigations by means of positron annihilation in II-VI compound semiconductors. Applied Physics A: Materials Science & Processing, 66(6), 599â614.

Authors 4

R. Krause-Rehberg (first)
H.S. Leipner (additional)
T. Abgarjan (additional)
A. Polity (additional)

References 0 Referenced 76

None

Dates

Type	When
Created	23 years ago (Aug. 25, 2002, 12:19 a.m.)
Deposited	6 years, 3 months ago (May 28, 2019, 4:56 a.m.)
Indexed	2 days, 5 hours ago (Aug. 27, 2025, 12:32 p.m.)
Issued	27 years, 2 months ago (June 1, 1998)
Published	27 years, 2 months ago (June 1, 1998)
Published Print	27 years, 2 months ago (June 1, 1998)

Funders 0

None

BibTeX

@article{Krause_Rehberg_1998, title={Review of defect investigations by means of positron annihilation in II-VI compound semiconductors}, volume={66}, ISSN={1432-0630}, url={http://dx.doi.org/10.1007/s003390050721}, DOI={10.1007/s003390050721}, number={6}, journal={Applied Physics A: Materials Science & Processing}, publisher={Springer Science and Business Media LLC}, author={Krause-Rehberg, R. and Leipner, H.S. and Abgarjan, T. and Polity, A.}, year={1998}, month=jun, pages={599–614} }

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