DOI: 10.1007/s10005-001-0012-4. Development of a Nanoindenter for In Situ Transmission Electron Microscopy

Development of a Nanoindenter for In Situ Transmission Electron Microscopy

10.1007/s10005-001-0012-4

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

AbstractIn situ transmission electron microscopy is an established experimental technique that permits direct observation of the dynamics and mechanisms of dislocation motion and deformation behavior. In this article, we detail the development of a novel specimen goniometer that allows real-time observations of the mechanical response of materials to indentation loads. The technology of the scanning tunneling microscope is adopted to allow nanometer-scale positioning of a sharp, conductive diamond tip onto the edge of an electron-transparent sample. This allows application of loads to nanometer-scale material volumes coupled with simultaneous imaging of the material’s response. The emphasis in this report is qualitative and technique oriented, with particular attention given to sample geometry and other technical requirements. Examples of the deformation of aluminum and titanium carbide as well as the fracture of silicon will be presented.

Bibliography

Stach, E. A., Freeman, T., Minor, A. M., Owen, D. K., Cumings, J., Wall, M. A., Chraska, T., Hull, R., Morris, J. W., Zettl, A., & Dahmen, U. (2001). Development of a Nanoindenter for In Situ Transmission Electron Microscopy. Microscopy and Microanalysis, 7(6), 507â517.

Authors 11

Eric A. Stach (first)
Tony Freeman (additional)
Andrew M. Minor (additional)
Doug K. Owen (additional)
John Cumings (additional)
Mark A. Wall (additional)
Tomas Chraska (additional)
Robert Hull (additional)
J.W. Morris (additional)
A. Zettl (additional)
Ulrich Dahmen (additional)

References 0 Referenced 88

None

Dates

Type	When
Created	5 years, 2 months ago (June 22, 2020, 4:49 p.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 6:31 a.m.)
Indexed	5 days, 19 hours ago (Aug. 23, 2025, 9:39 p.m.)
Issued	23 years, 9 months ago (Nov. 1, 2001)
Published	23 years, 9 months ago (Nov. 1, 2001)
Published Online	23 years, 6 months ago (Feb. 2, 2002)
Published Print	23 years, 9 months ago (Nov. 1, 2001)

Funders 0

None

BibTeX

@article{Stach_2001, title={Development of a Nanoindenter for In Situ Transmission Electron Microscopy}, volume={7}, ISSN={1435-8115}, url={http://dx.doi.org/10.1007/s10005-001-0012-4}, DOI={10.1007/s10005-001-0012-4}, number={6}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Stach, Eric A. and Freeman, Tony and Minor, Andrew M. and Owen, Doug K. and Cumings, John and Wall, Mark A. and Chraska, Tomas and Hull, Robert and Morris, J.W. and Zettl, A. and Dahmen, Ulrich}, year={2001}, month=nov, pages={507–517} }

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