DOI: 10.1007/bf02520978. Application of ionic microanalysis to the determination of boron depth profiles in silicon and silica

Application of ionic microanalysis to the determination of boron depth profiles in silicon and silica

10.1007/bf02520978

Crossref journal-article

Springer Science and Business Media LLC

Journal of Radioanalytical Chemistry (297)

Bibliography

Blanchard, B., Hilleret, N., & Quoirin, J. B. (1972). Application of ionic microanalysis to the determination of boron depth profiles in silicon and silica. Journal of Radioanalytical Chemistry, 12(2), 85â94.

Authors 3

B. Blanchard (first)
N. Hilleret (additional)
J. B. Quoirin (additional)

References 6 Referenced 19

G. Slodzian, Thesis,Ann. Phys., 9 (1964) 591. (10.1051/anphys/196413090591) / Ann. Phys. by G. Slodzian (1964)
J. M. Rouberol et al., 16th Ann. Conf. on Mass Spectrometry and Allied Topics, Pitts burgh, 1968.
G. Slodzian, Private communication.
G. Slodzian, J. F. Hennequin,Compt. rend. Acad. Sci., 263B (1968) 1246. / Compt. rend. Acad. Sci. by G. Slodzian (1968)
J. F. Hennequin Thesis, C.N.R.S. AO 2098.
B. Blanchard, N. Hilleret, J. Monnier, to be published.

Dates

Type	When
Created	18 years, 9 months ago (Nov. 7, 2006, 4 p.m.)
Deposited	6 years, 3 months ago (May 19, 2019, 4:29 p.m.)
Indexed	1 year, 6 months ago (Feb. 5, 2024, 8:08 a.m.)
Issued	52 years, 9 months ago (Dec. 1, 1972)
Published	52 years, 9 months ago (Dec. 1, 1972)
Published Print	52 years, 9 months ago (Dec. 1, 1972)

Funders 0

None

BibTeX

@article{Blanchard_1972, title={Application of ionic microanalysis to the determination of boron depth profiles in silicon and silica}, volume={12}, ISSN={1588-2780}, url={http://dx.doi.org/10.1007/bf02520978}, DOI={10.1007/bf02520978}, number={2}, journal={Journal of Radioanalytical Chemistry}, publisher={Springer Science and Business Media LLC}, author={Blanchard, B. and Hilleret, N. and Quoirin, J. B.}, year={1972}, month=dec, pages={85–94} }

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