DOI: 10.1007/bf01538384. Dielectric and optical properties of C60 material studied by ellipsometry and quantitative IR and UV/VIS spectroscopy

Dielectric and optical properties of C60 material studied by ellipsometry and quantitative IR and UV/VIS spectroscopy

10.1007/bf01538384

Crossref journal-article

Springer Science and Business Media LLC

Applied Physics A Materials Science and Processing (297)

Bibliography

Richter, A., & Sturm, J. (1995). Dielectric and optical properties of C60 material studied by ellipsometry and quantitative IR and UV/VIS spectroscopy. Applied Physics A Materials Science and Processing, 61(2), 163â170.

Authors 2

A. Richter (first)
J. Sturm (additional)

References 33 Referenced 22

H.W. Kroto, J.R. Heath, S.C. O'Brien, R.F. Curl, R.E. Smalley: Nature318, 162 (1985) (10.1038/318162a0) / Nature by H.W. Kroto (1985)
H. Ajie, M.M. Alvarez, S.J. Anz, R.D. Beck, F. Diederich, K. Fostiropoulos, W. Krätschmer, Y. Rubin, K.E. Shriver, D. Sensharma, R.L. Whetten: J. Phys. Chem.94, 8630 (1990) (10.1021/j100387a004) / J. Phys. Chem. by H. Ajie (1990)
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A.F. Hebard, R.C. Haddon, R.M. Fleming, A.R. Kortan: Appl. Phys. Lett.59, 2109 (1991) (10.1063/1.106095) / Appl. Phys. Lett. by A.F. Hebard (1991)
S.L. Ren, Y. Wang, A.M. Rao, E. McRae, J.M. Holden, T. Hager, K.A. Wang, W.T. Lee, H.F. Ni, J. Selegue, P.C. Eklund: Appl. Phys. Lett.59, 2678 (1991) (10.1063/1.105907) / Appl. Phys. Lett. by S.L. Ren (1991)
A. Skumanich: Chem. Phys. Lett.182, 486 (1991) (10.1016/0009-2614(91)90112-M) / Chem. Phys. Lett. by A. Skumanich (1991)
G. Gensterblum, J.J. Pireaux, P.A. Thiry, R. Caudano, J.P. Vigneron, Ph. Lambin, A.A. Lucas, W. Krätschmer: Phys. Rev. Lett.67, 2171 (1991) (10.1103/PhysRevLett.67.2171) / Phys. Rev. Lett. by G. Gensterblum (1991)
P.N. Saeta, B.I. Greene, A.R. Kortan, N. Kopylov, F.A. Thiel: Chem. Phys. Lett.190, 184 (1992) (10.1016/0009-2614(92)85323-3) / Chem. Phys. Lett. by P.N. Saeta (1992)
E. Sohmen, J. Fink, W. Krätschmer: Z. Phys. B86, 87 (1992) (10.1007/BF01323552) / Z. Phys. B by E. Sohmen (1992)
E. Sohmen, J. Fink, W. Krätschmer: Europhys. Lett.17, 51 (1992) (10.1209/0295-5075/17/1/010) / Europhys. Lett. by E. Sohmen (1992)
M.K. Kelly, P. Etchegoin, D. Fuchs, W. Krätschmer, K. Fostiropoulos: Phys. Rev. B46, 4963 (1992) (10.1103/PhysRevB.46.4963) / Phys. Rev. B by M.K. Kelly (1992)
P. Milani, M. Manfredi, G. Guizzetti, F. Marabelli, M. Patrini: Solid State Commun.90, 639 (1994) (10.1016/0038-1098(94)90537-1) / Solid State Commun. by P. Milani (1994)
S. Saito, A. Oshiyama: Phys. Rev. Lett.66, 2637 (1991) (10.1103/PhysRevLett.66.2637) / Phys. Rev. Lett. by S. Saito (1991)
W.Y. Ching, M.Z. Huang, Y.N. Xu, W.G. Harter, F.T. Chan: Phys. Rev. Lett.67, 2045 (1991) (10.1103/PhysRevLett.67.2045) / Phys. Rev. Lett. by W.Y. Ching (1991)
E.L. Shirley, S.G. Louie: Phys. Rev. Lett.71, 133 (1993) (10.1103/PhysRevLett.71.133) / Phys. Rev. Lett. by E.L. Shirley (1993)
F.W. Smith: J. Appl. Phys.55, 764 (1994) (10.1063/1.333135) / J. Appl. Phys. by F.W. Smith (1994)
A. Richter, H.-J. Scheibe, W. Pompe, K.-W. Brzezinka, I. Mühling: J. Non-Cryst. Solids88, 131 (1986) (10.1016/S0022-3093(86)80093-X) / J. Non-Cryst. Solids by A. Richter (1986)
N. Savvides: J. Appl. Phys.59, 4133 (1986) (10.1063/1.336672) / J. Appl. Phys. by N. Savvides (1986)
A. Richter, K.-W. Brzezinka, P. Reich, J. Erxmeyer, B. Mertesacker, H.-J. Scheibe, D. Drescher: Phys. Rev. B (1994) (submitted)
A. Richter, B. Winzer, G. Keßler, J. Erxmeyer, B. Mertesacker, A. Weidinger, K.-W. Brzezinka:Int'l Conf. Charge Transfer at Fullerenes, Bad Schandau, Germany (1993)
R.M.A. Azzam, N.M. Bashara:Ellipsometry and Polarized Light (North-Holland, Amsterdam 1977) / Ellipsometry and Polarized Light by R.M.A. Azzam (1977)
M. Born, E. Wolf:Principles of Optics (Pergamon Oxford 1980) / Principles of Optics by M. Born (1980)
A. Röseler:Infrared Spectroscopy Ellipsometry (Akademie, Berlin 1990) / Infrared Spectroscopy Ellipsometry by A. Röseler (1990)
F. Wooten:Optical Properties of Solids (Academic, New York 1972) / Optical Properties of Solids by F. Wooten (1972)
J.-Th. Zettler, Th. Trepk, L. Spanos, Y.-Z. Hu, W. Richter: Private communication
J. Sturm:Int'l Conf. Charge Transfer at Fullerenes, Bad Schandau, Germany (1993)
K.-A. Wang, A.M. Rao, P.C. Eklund, M.S. Dresselhaus, G. Dresselhaus: Phys. Rev. B48, 11375 (1994) (10.1103/PhysRevB.48.11375) / Phys. Rev. B by K.-A. Wang (1994)
J. Brunn, B. Harbecke: Private communication
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B. Heinz: Optische Konstanten von Halbleiter-Mehrschichtsystemen. Dissertation, RWTH Aachen (1991)
S. Adachi: J. Appl. Phys.66, 3224 (1989) (10.1063/1.344140) / J. Appl. Phys. by S. Adachi (1989)
D. Fink, R. Klett, J. Sturm: Unpublished

Dates

Type	When
Created	20 years, 4 months ago (April 21, 2005, 2:29 a.m.)
Deposited	6 years, 3 months ago (May 3, 2019, 9:14 a.m.)
Indexed	4 days, 1 hour ago (Aug. 21, 2025, 2:06 p.m.)
Issued	30 years ago (Aug. 1, 1995)
Published	30 years ago (Aug. 1, 1995)
Published Print	30 years ago (Aug. 1, 1995)

Funders 0

None

BibTeX

@article{Richter_1995, title={Dielectric and optical properties of C60 material studied by ellipsometry and quantitative IR and UV/VIS spectroscopy}, volume={61}, ISSN={1432-0630}, url={http://dx.doi.org/10.1007/bf01538384}, DOI={10.1007/bf01538384}, number={2}, journal={Applied Physics A Materials Science and Processing}, publisher={Springer Science and Business Media LLC}, author={Richter, A. and Sturm, J.}, year={1995}, month=aug, pages={163–170} }

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