DOI: 10.1007/bf00332201. Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples

Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples

10.1007/bf00332201

Crossref journal-article

Springer Science and Business Media LLC

Applied Physics A Solids and Surfaces (297)

Bibliography

Bielefeldt, H., Hï¿½rsch, I., Krausch, G., Lux-Steiner, M., Mlynek, J., & Marti, O. (1994). Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples. Applied Physics A Solids and Surfaces, 59(2), 103â108.

Authors 6

H. Bielefeldt (first)
I. H�rsch (additional)
G. Krausch (additional)
M. Lux-Steiner (additional)
J. Mlynek (additional)
O. Marti (additional)

References 13 Referenced 50

D.W. Pohl, W. Denk, M. Lanz: Appl. Phys. Lett. 44, 651 (1984) (10.1063/1.94865) / Appl. Phys. Lett. by D.W. Pohl (1984)
U.Ch. Fischer, U.T. Dürig, D.W. Pohl: Appl. Phys. Lett. 52, 249 (1988) (10.1063/1.99483) / Appl. Phys. Lett. by U.Ch. Fischer (1988)
R.C. Reddick, R.J. Warmack, T.L. Ferrell: Phys. Rev. B 39, 767 (1989) (10.1103/PhysRevB.39.767) / Phys. Rev. by R.C. Reddick (1989)
D. Courjon, K. Sarrayeddine, M. Spajer: Opt. Commun. 71, 23 (1989) (10.1016/0030-4018(89)90297-6) / Opt. Commun. by D. Courjon (1989)
M. Spajer, D. Courjon, K. Sarayeddine, A. Jalocha, J.-M. Vigoureux: J. Phys. (Paris) III 1, 1 (1991) / J. Phys. by M. Spajer (1991)
D.W. Pohl: In Advances in Optical and Electron Microscopy (Academic, New York 1991) pp. 243?312 / Advances in Optical and Electron Microscopy by D.W. Pohl (1991)
E. Betzig, P.L., Finn, J.S. Weiner: Appl. Phys. Lett. 60, 2484 (1992) (10.1063/1.106940) / Appl. Phys. Lett. by E. Betzig (1992)
R. Toledo-Crow, P.C. Yang, Y. Chen, M. Vaez-Iravani: Appl. Phys. Lett. 60, 2957 (1992) (10.1063/1.106801) / Appl. Phys. Lett. by R. Toledo-Crow (1992)
SiO2 monomode fibers with GeO2 doped core were kindly provided by Siecor GmbH, Neustadt/Coburg, Germany
Model P-2000 fiber puller, Sutter Instrument Company, Novato CA, USA
The pattern was originally designed by J. Cline and fabricated in collaboration with J. Cline and G. Valaskovicz
F. Bruder, R. Brenn: Phys. Rev. Lett. 69, 624 (1992). The PS/PBrS samples studied in this work were kindly provided by F. Bruder and R. Brenn, Albert-Ludwigs-Universität, Freiburg, Germany (10.1103/PhysRevLett.69.624) / Phys. Rev. Lett. by F. Bruder (1992)
M. Pirzer, M.Ch. Lux-Steiner, E. Bucher: Appl. Phys. Lett. 60, 2957 (1992) (10.1063/1.106801) / Appl. Phys. Lett. by M. Pirzer (1992)

Dates

Type	When
Created	20 years, 9 months ago (Oct. 24, 2004, 7:39 a.m.)
Deposited	6 years, 4 months ago (April 8, 2019, 3:23 p.m.)
Indexed	1 month, 2 weeks ago (July 1, 2025, 6:04 a.m.)
Issued	31 years ago (Aug. 1, 1994)
Published	31 years ago (Aug. 1, 1994)
Published Print	31 years ago (Aug. 1, 1994)

Funders 0

None

BibTeX

@article{Bielefeldt_1994, title={Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples}, volume={59}, ISSN={1432-0630}, url={http://dx.doi.org/10.1007/bf00332201}, DOI={10.1007/bf00332201}, number={2}, journal={Applied Physics A Solids and Surfaces}, publisher={Springer Science and Business Media LLC}, author={Bielefeldt, H. and H�rsch, I. and Krausch, G. and Lux-Steiner, M. and Mlynek, J. and Marti, O.}, year={1994}, month=aug, pages={103–108} }

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