DOI: 10.1007/978-3-7091-6679-6_16. The Scanning Very-Low-Energy Electron Microscope (SVLEEM)

The Scanning Very-Low-Energy Electron Microscope (SVLEEM)

10.1007/978-3-7091-6679-6_16

Crossref book-chapter

Springer Vienna

Mikrochimica Acta (297)

Bibliography

MÃ¼llerovÃ¡, I., & Lenc, M. (1992). The Scanning Very-Low-Energy Electron Microscope (SVLEEM). Electron Microbeam Analysis, 173â177.

Authors 2

Ilona Müllerová (first)
Michal Lenc (additional)

References 9 Referenced 15

E. Bauer, in: Studies in Surface Science and Catalysis 36, J. Koukal, ed., Elsevier, Amsterdam, 1988, p.26. / Studies in Surface Science and Catalysis 36 by E Bauer (1988)
W. Telieps, E. Bauer, Ultramicroscopy 1985, 17, 57. (10.1016/0304-3991(85)90177-9) / Ultramicroscopy by W Telieps (1985)
M. Lenc, Čs. Čas. Fyz. 1975, A25, 28 (in Czech). / Čs. Čas. Fyz by M Lenc (1975)
T. Ichinokawa, in: Proc. X11th ICXOM (S. Jasienska, L. J. Maksymowicz, eds.), Acad. Min. and Metallurgy, Cracow, 1989,25.
R. S. Paden, W. C. Nixon, J. Phys. E: Sci. Instr. 1968, 1, 1073. (10.1088/0022-3735/1/11/305) / J. Phys. E: Sci. Instr by RS Paden (1968)
J. Frosien, E. Plies, K. Anger, J. Vac. Sci. Technol. 1989, B7, 1874. (10.1116/1.584683) / J. Vac. Sci. Technol by J Frosien (1989)
I. Müllerova, M. Lenc, in: Proc. X 11th ICEM (L. D. Peachey, D. B. Williams, eds.), San Francisco Press, San Francisco, 1990, p. 398.
O. Scherzer, Ultramicroscopy, 1982, 9, 385. (10.1016/0304-3991(82)90100-0) / Ultramicroscopy by O Scherzer (1982)
E. Munro, J. Orloff, R. Rutherford, J. Wallmark, J. Vac. Sci. Technol. 1988, B6, 1971. (10.1116/1.584147) / J. Vac. Sci. Technol by E Munro (1988)

Dates

Type	When
Created	14 years ago (Aug. 3, 2011, 10:49 p.m.)
Deposited	4 years, 9 months ago (Nov. 23, 2020, 4:39 a.m.)
Indexed	2 months ago (June 26, 2025, 9:30 a.m.)
Issued	33 years, 7 months ago (Jan. 1, 1992)
Published	33 years, 7 months ago (Jan. 1, 1992)
Published Print	33 years, 7 months ago (Jan. 1, 1992)

Funders 0

None

BibTeX

@inbook{M_llerov__1992, title={The Scanning Very-Low-Energy Electron Microscope (SVLEEM)}, ISBN={9783709166796}, ISSN={0076-8642}, url={http://dx.doi.org/10.1007/978-3-7091-6679-6_16}, DOI={10.1007/978-3-7091-6679-6_16}, booktitle={Electron Microbeam Analysis}, publisher={Springer Vienna}, author={Müllerová, Ilona and Lenc, Michal}, year={1992}, pages={173–177} }

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