DOI: 10.1007/978-3-642-55615-9. Point Defects in Semiconductors and Insulators

Point Defects in Semiconductors and Insulators

10.1007/978-3-642-55615-9

Crossref book

Springer Berlin Heidelberg

Springer Series in Materials Science (297)

Bibliography

Spaeth, J.-M., & Overhof, H. (2003). Point Defects in Semiconductors and Insulators. In Springer Series in Materials Science. Springer Berlin Heidelberg.

Authors 2

Johann-Martin Spaeth (first)
Harald Overhof (additional)

References 0 Referenced 75

None

Dates

Type	When
Created	13 years, 9 months ago (Nov. 14, 2011, 8:20 a.m.)
Deposited	5 years, 6 months ago (Jan. 30, 2020, 2:18 a.m.)
Indexed	11 months, 2 weeks ago (Sept. 6, 2024, 10:38 a.m.)
Issued	22 years, 7 months ago (Jan. 1, 2003)
Published	22 years, 7 months ago (Jan. 1, 2003)
Published Print	22 years, 7 months ago (Jan. 1, 2003)

Funders 0

None

BibTeX

@book{Spaeth_2003, title={Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions}, ISBN={9783642556159}, ISSN={2196-2812}, url={http://dx.doi.org/10.1007/978-3-642-55615-9}, DOI={10.1007/978-3-642-55615-9}, journal={Springer Series in Materials Science}, publisher={Springer Berlin Heidelberg}, author={Spaeth, Johann-Martin and Overhof, Harald}, year={2003} }

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