DOI: 10.1007/978-3-540-71491-0_4. Passivation and Characterization of Germanium Surfaces

Passivation and Characterization of Germanium Surfaces

10.1007/978-3-540-71491-0_4

Crossref book-chapter

Springer Berlin Heidelberg

Advanced Microelectronics (297)

Bibliography

Amy, S. R., & Chabal, Y. J. (n.d.). Passivation and Characterization of Germanium Surfaces. Advanced Gate Stacks for High-Mobility Semiconductors, 73â113.

Authors 2

S. R. Amy (first)
Y. J. Chabal (additional)

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Dates

Type	When
Created	17 years, 8 months ago (Dec. 31, 2007, 6:18 a.m.)
Deposited	4 years, 4 months ago (April 27, 2021, 5:50 a.m.)
Indexed	1 year ago (Sept. 4, 2024, 9:30 p.m.)

Funders 0

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BibTeX

@inbook{Amy, title={Passivation and Characterization of Germanium Surfaces}, ISBN={9783540714910}, url={http://dx.doi.org/10.1007/978-3-540-71491-0_4}, DOI={10.1007/978-3-540-71491-0_4}, booktitle={Advanced Gate Stacks for High-Mobility Semiconductors}, publisher={Springer Berlin Heidelberg}, author={Amy, S. R. and Chabal, Y. J.}, pages={73–113} }

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