DOI: 10.1007/978-3-319-51382-9_36. Important Factors to Consider in FIB Milling of Crystalline Materials

Important Factors to Consider in FIB Milling of Crystalline Materials

10.1007/978-3-319-51382-9_36

Crossref book-chapter

Springer International Publishing

The Minerals, Metals & Materials Series (297)

Bibliography

Li, J., & Liu, P. (2017). Important Factors to Consider in FIB Milling of Crystalline Materials. Characterization of Minerals, Metals, and Materials 2017, 329â336.

Authors 2

Jian Li (first)
Pei Liu (additional)

References 12 Referenced 3

Cerva H et al (1993) For testing and failure analysis. Inst Phys Conf Ser 134:133 / Inst Phys Conf Ser by H Cerva (1993)
Rajsiri S et al (2002) FIB damage in silicon: amorphization or redeposition? Microsc Microanal 8(Suppl 2):50–51 (10.1017/S1431927602101577)
Mayer J et al (2007) TEM sample preparation and FIB-induced damage. MRS Bull 32:400–407 (10.1557/mrs2007.63) / MRS Bull by J Mayer (2007)
Li J (2008) The detection of local plastic strain in microscopic scale. Mater Lett 62(6–7):804–807 (10.1016/j.matlet.2007.06.065)
Li J (2008) Advances in materials engineering using state-of-the-art microstructural characterization tools. In: New material science research. Nova Science Publishers Inc. ISBN-13:978-1-60021-645-1
Li J (2008) Advanced techniques in TEM specimen preparation. In: Khan M (ed) The transmission electron microscope. ISBN: 979-953-307-311-7
Phaneuf MW, Li J, Casey JD Jr (2002) The focused-ion-beam microscope—more than a precision ion milling machine. Microsc Microanal 8(Suppl 2):52
Bassim ND et al (2012) Minimizing damage during FIB sample preparation of soft materials. J Microsc 245:288–301 (10.1111/j.1365-2818.2011.03570.x) / J Microsc by ND Bassim (2012)
Ishitani T, Kaga H (1995) Calculation of local temperature rise in focused-ion-beam sample preparation. Microsc 44:331–336
Carlslaw HS, Jaeger JC (1959) Conduction of heat in solids, 2nd edn. Oxford University Press, Oxford, p 164
Bulletin MRS (1996) Thermal conductivity of common solids
Li J (2015) Specimen temperature-increase considerations during FIB milling. Microsc 63(1):3–10 / Microsc by J Li (2015)

Dates

Type	When
Created	8 years, 6 months ago (Feb. 6, 2017, 12:14 a.m.)
Deposited	5 years, 11 months ago (Sept. 18, 2019, 1:09 a.m.)
Indexed	4 months, 3 weeks ago (March 28, 2025, 4:13 a.m.)
Issued	8 years, 7 months ago (Jan. 1, 2017)
Published	8 years, 7 months ago (Jan. 1, 2017)
Published Online	8 years, 6 months ago (Feb. 7, 2017)
Published Print	8 years, 7 months ago (Jan. 1, 2017)

Funders 0

None

BibTeX

@inbook{Li_2017, title={Important Factors to Consider in FIB Milling of Crystalline Materials}, ISBN={9783319513829}, ISSN={2367-1696}, url={http://dx.doi.org/10.1007/978-3-319-51382-9_36}, DOI={10.1007/978-3-319-51382-9_36}, booktitle={Characterization of Minerals, Metals, and Materials 2017}, publisher={Springer International Publishing}, author={Li, Jian and Liu, Pei}, year={2017}, pages={329–336} }

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