DOI: 10.1007/978-1-4757-9027-6. Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

10.1007/978-1-4757-9027-6

Crossref book

Springer US

[] (297)

Bibliography

Newbury, D. E., Joy, D. C., Echlin, P., Fiori, C. E., & Goldstein, J. I. (1986). Advanced Scanning Electron Microscopy and X-Ray Microanalysis. Springer US.

Authors 5

Dale E. Newbury (first)
David C. Joy (additional)
Patrick Echlin (additional)
Charles E. Fiori (additional)
Joseph I. Goldstein (additional)

References 0 Referenced 151

None

Dates

Type	When
Created	12 years, 2 months ago (June 13, 2013, 9:57 p.m.)
Deposited	6 years, 4 months ago (April 5, 2019, 10:16 p.m.)
Indexed	2 weeks, 6 days ago (Aug. 5, 2025, 8:23 a.m.)
Issued	39 years, 7 months ago (Jan. 1, 1986)
Published	39 years, 7 months ago (Jan. 1, 1986)
Published Print	39 years, 7 months ago (Jan. 1, 1986)

Funders 0

None

BibTeX

@book{Newbury_1986, title={Advanced Scanning Electron Microscopy and X-Ray Microanalysis}, ISBN={9781475790276}, url={http://dx.doi.org/10.1007/978-1-4757-9027-6}, DOI={10.1007/978-1-4757-9027-6}, publisher={Springer US}, author={Newbury, Dale E. and Joy, David C. and Echlin, Patrick and Fiori, Charles E. and Goldstein, Joseph I.}, year={1986} }

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