DOI: 10.1007/978-1-4615-9537-3_9. Reflection Electron Microscopy

10.1007/978-1-4615-9537-3_9

Crossref book-chapter

Springer US

Surface and Interface Characterization by Electron Optical Methods (297)

Bibliography

Cowley, J. M. (1988). Reflection Electron Microscopy. Surface and Interface Characterization by Electron Optical Methods, 127â158.

Authors 1

John M. Cowley (first)

References 51 Referenced 10

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Dates

Type	When
Created	13 years, 2 months ago (June 6, 2012, 5:09 p.m.)
Deposited	3 years, 7 months ago (Jan. 16, 2022, 12:25 p.m.)
Indexed	11 months, 3 weeks ago (Sept. 7, 2024, 1:29 a.m.)
Issued	37 years, 7 months ago (Jan. 1, 1988)
Published	37 years, 7 months ago (Jan. 1, 1988)
Published Print	37 years, 7 months ago (Jan. 1, 1988)

Funders 0

None

BibTeX

@inbook{Cowley_1988, title={Reflection Electron Microscopy}, ISBN={9781461595373}, url={http://dx.doi.org/10.1007/978-1-4615-9537-3_9}, DOI={10.1007/978-1-4615-9537-3_9}, booktitle={Surface and Interface Characterization by Electron Optical Methods}, publisher={Springer US}, author={Cowley, John M.}, year={1988}, pages={127–158} }

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