DOI: 10.1007/978-1-4613-9972-8_34. Improved Techniques of Lattice Parameter Measurements Using Two X-Ray Beams

Improved Techniques of Lattice Parameter Measurements Using Two X-Ray Beams

10.1007/978-1-4613-9972-8_34

Crossref book-chapter

Springer US

Advances in X-Ray Analysis (297)

Bibliography

Kishino, S. (1973). Improved Techniques of Lattice Parameter Measurements Using Two X-Ray Beams. Advances in X-Ray Analysis, 367â378.

Authors 1

Seigo Kishino (first)

References 14 Referenced 6

For example, G. L. Clark, Editor, The Encyclopedia of X-Rays and Gamma Rays, Reinhold Publishing Co., New York (1963),’P. 696. / The Encyclopedia of X-Rays and Gamma Rays by GL Clark (1963)
K. Lonsdale, “Divergent-Beam X-Ray Photography of Crystals*” Phil. Trans. Roy. Soc. London 240, 219(1947). (10.1098/rsta.1947.0002)
W. L. Bond, “Precision Lattice Constant Determination,11 Acta Cryst. 13, 814(1960). / Acta Cryst by WL Bond (1960)
R. Bubákobá and Z. Szmid, “Proton Bombardment Damage in Silicon,” Phys. Stat. Sol. 8, 105(1965). / Acta Cryst by R Bubákobá (1965)
M. Hart, “High Precision Lattice Parameter Measurements by Multiple Bragg Reflection Diffractometry,” Proc. Roy. Soc. A309, 281(1969). (10.1098/rspa.1969.0042) / Proc. Roy. Soc. by M Hart (1969)
S. Kishino, “Determination of the Mole Fraction of GaP in GaAsP Single Crystal by A New X-Ray Diffraction Technique,” Japan. J. appl. Phys. 10, 1113(1971). (10.1143/JJAP.10.1113) / Japan. J. appl. Phys. by S Kishino (1971)
S. Popovic, “An X-Ray Diffraction Method for Lattice Parameter Measurements from Corresponding K α 1 and K β 1 Reflections,” J. Appl. Cryst. 1, 240(1971). (10.1103/PhysRev.52.872) / Phys. Rev. by S Popovic (1937)
J. W. M. DuMond, “Theory of the Use of More Than Two Successive X-Ray Crystal Reflections to Obtain Increased Resolving Power,” Phys. Rev. 52, 872(1937). (10.1103/PhysRev.52.872) / Phys. Rev. by JWM Mond Du (1937)
K. Kohra, H. Hashizume, and J. Yoshimura, “X-Ray Dif fraction Topography Utilizing Double Crystal Arrangement of (+,+) or Non-Parallel (+,-) Setting,” Japan J. appl. Phys. 9, 1029 (1970). (10.1143/JJAP.9.1029) / Japan J. appl. Phys. by K Kohra (1970)
J. A. Bearden, “X-Ray Wavelengths,” Rev. Mod. Phys. 39, 78 (1967). (10.1103/RevModPhys.39.78) / Rev. Mod. Phys. by JA Bearden (1967)
G. L. Pearson and J. Bardeen, “Electorical Properties of Pure Silicon and Silicon Alloys Containing Boron and Phosphorus,” Phys. Rev. 75, 865(1949). (10.1103/PhysRev.97.666) / Phys. Rev. by GL Pearson (1955)
F. H. Horn, “Densitometrie and Eleetorical Investigation of Boron in Silicon,” Phys. Rev. 97, 1521(1955). (10.1103/PhysRev.97.1521) / Phys. Rev. by FH Horn (1955)
B. G. Cohen, “X-Ray Measurement of Elastic Strain and Lattice Constant of Diffused Silicon,” Solid-State Electronics, Pergamon Press 1967, Great Britain, vol. 10, P. 33. (10.1016/0038-1101(67)90110-4) / Solid-State Electronics by BG Cohen (1967)
S. Kishino, M. Ogirima, and K. Kurata, “A Cross-Hatch Pattern in GaAsP Epitaxially Grown on GaAs Substrate,” J. Electrochem. Soc. 119, 617(1972). (10.1149/1.2404273) / J. Electrochem. Soc. by S Kishino (1972)

Dates

Type	When
Created	13 years, 4 months ago (April 3, 2012, 12:12 p.m.)
Deposited	4 years, 4 months ago (May 1, 2021, 4:03 a.m.)
Indexed	11 months, 3 weeks ago (Sept. 6, 2024, 9:35 p.m.)
Issued	52 years, 8 months ago (Jan. 1, 1973)
Published	52 years, 8 months ago (Jan. 1, 1973)
Published Print	52 years, 8 months ago (Jan. 1, 1973)

Funders 0

None

BibTeX

@inbook{Kishino_1973, title={Improved Techniques of Lattice Parameter Measurements Using Two X-Ray Beams}, ISBN={9781461399728}, url={http://dx.doi.org/10.1007/978-1-4613-9972-8_34}, DOI={10.1007/978-1-4613-9972-8_34}, booktitle={Advances in X-Ray Analysis}, publisher={Springer US}, author={Kishino, Seigo}, year={1973}, pages={367–378} }

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