DOI: 10.1007/978-0-387-28668-6_8. Principles of Near-Field Microwave Microscopy

Principles of Near-Field Microwave Microscopy

10.1007/978-0-387-28668-6_8

Crossref book-chapter

Springer New York

Scanning Probe Microscopy (297)

Bibliography

Anlage, S. M., Talanov, V. V., & Schwartz, A. R. (n.d.). Principles of Near-Field Microwave Microscopy. Scanning Probe Microscopy, 215â253.

Authors 3

Steven M. Anlage (first)
Vladimir V. Talanov (additional)
Andrew R. Schwartz (additional)

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Dates

Type	When
Created	18 years, 4 months ago (April 2, 2007, 8:04 p.m.)
Deposited	7 months, 1 week ago (Jan. 15, 2025, 7:02 a.m.)
Indexed	4 weeks, 1 day ago (July 27, 2025, 3:13 a.m.)

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BibTeX

@inbook{Anlage, title={Principles of Near-Field Microwave Microscopy}, ISBN={9780387286679}, url={http://dx.doi.org/10.1007/978-0-387-28668-6_8}, DOI={10.1007/978-0-387-28668-6_8}, booktitle={Scanning Probe Microscopy}, publisher={Springer New York}, author={Anlage, Steven M. and Talanov, Vladimir V. and Schwartz, Andrew R.}, pages={215–253} }

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