DOI: 10.1007/3-540-11986-8_11. Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon

Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon

10.1007/3-540-11986-8_11

Crossref book-chapter

Springer Berlin Heidelberg

Lecture Notes in Physics (297)

Bibliography

Bender, H., Van Landuyt, J., Amelinckx, S., Claeys, C., Declerck, G., & Van Overstraeten, R. (1983). Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon. Defect Complexes in Semiconductor Structures, 134â139.

Authors 6

H. Bender (first)
J. Van Landuyt (additional)
S. Amelinckx (additional)
C. Claeys (additional)
G. Declerck (additional)
R. Van Overstraeten (additional)

References 12 Referenced 1

D.M. Maher, A. Staudinger, J.R. Patel, J. Appl. Phys. 47, 3813 (1976) (10.1063/1.323241) / J. Appl. Phys. by D. M. Maher (1976)
H. Takaoka, J. Oosaka, N. Inoue, Jpn. J. Appl. Phys. 18, suppl. 18-1, 179 (1979) (10.7567/JJAPS.18S1.179) / Jpn. J. Appl. Phys. by H. Takaoka (1979)
H. Bender, J. Van Landuyt, S. Amelinckx, C. Claeys, G. Declerck, R. Van Overstraeten, Inst. Phys. Conf. Ser. no60, 313 (1981)
C. Claeys, H. Bender, G. Declerck, J. Van Landuyt, R. Van Overstraeten, S. Amelinckx, Proc. of the 12th International Conference on Defects in Semiconductors, 31/8-3/9/82, Amsterdam, to be published in Physica B
K. Wada, H. Takaoka, N. Inoue, K. Kohra, Jpn. J. Appl. Phys. 18, 1629 (1979) (10.1143/JJAP.18.1629) / Jpn. J. Appl. Phys. by K. Wada (1979)
A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton, C.T. Forwood, in “Computer Electron Micrographs and Defect Identification”, S. Amelinckx, R. Gevers, J. Nihoul, eds., North-Holland (1973)
J. Grilhé, K. Seshan, J. Washburn, Rad. Effects 27, 115 (1975) (10.1080/00337577508233018) / Rad. Effects by J. Grilhé (1975)
J.A. Lambert, P.S. Dobson, Phil. Mag. A 37, 441 (1978) (10.1080/01418617808239180) / Phil. Mag. A by J. A. Lambert (1978)
J.A. Lambert, P.S. Dobson, Phil. Mag. A 44, 1043 (1981) (10.1080/01418618108235793) / Phil. Mag. A by J. A. Lambert (1981)
I.G. Salisbury, to be published in Acta Met.
H. Föll, C.B. Carter, Phil. Mag. A 40, 497 (1979) (10.1080/01418617908234855) / Phil. Mag. A by H. Föll (1979)
S. Kawado, Jpn. J. Appl. Phys. 19, 815 (1980) (10.1143/JJAP.19.815) / Jpn. J. Appl. Phys. by S. Kawado (1980)

Dates

Type	When
Created	17 years, 4 months ago (April 6, 2008, 7:21 p.m.)
Deposited	6 years, 6 months ago (Jan. 31, 2019, 3:23 p.m.)
Indexed	11 months, 2 weeks ago (Sept. 4, 2024, 11:21 p.m.)
Issued	42 years, 7 months ago (Jan. 1, 1983)
Published	42 years, 7 months ago (Jan. 1, 1983)
Published Online	20 years, 2 months ago (May 25, 2005)
Published Print	42 years, 7 months ago (Jan. 1, 1983)

Funders 0

None

BibTeX

@inbook{Bender_1983, title={Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon}, ISBN={9783540394563}, ISSN={1616-6361}, url={http://dx.doi.org/10.1007/3-540-11986-8_11}, DOI={10.1007/3-540-11986-8_11}, booktitle={Defect Complexes in Semiconductor Structures}, publisher={Springer Berlin Heidelberg}, author={Bender, H. and Van Landuyt, J. and Amelinckx, S. and Claeys, C. and Declerck, G. and Van Overstraeten, R.}, year={1983}, pages={134–139} }

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