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Elsevier BV
Journal of Colloid and Interface Science (78)
Bibliography

Richard Bowen, W., & Doneva, T. A. (2000). Atomic Force Microscopy Studies of Membranes: Effect of Surface Roughness on Double-Layer Interactions and Particle Adhesion. Journal of Colloid and Interface Science, 229(2), 544–549.

Authors 2
  1. W. Richard Bowen (first)
  2. Teodora A. Doneva (additional)
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Dates
Type When
Created 22 years, 11 months ago (Sept. 18, 2002, 8:56 a.m.)
Deposited 6 years, 3 months ago (May 8, 2019, 11:54 p.m.)
Indexed 1 month, 1 week ago (July 16, 2025, 8:51 a.m.)
Issued 24 years, 11 months ago (Sept. 1, 2000)
Published 24 years, 11 months ago (Sept. 1, 2000)
Published Print 24 years, 11 months ago (Sept. 1, 2000)
Funders 0

None

@article{Richard_Bowen_2000, title={Atomic Force Microscopy Studies of Membranes: Effect of Surface Roughness on Double-Layer Interactions and Particle Adhesion}, volume={229}, ISSN={0021-9797}, url={http://dx.doi.org/10.1006/jcis.2000.6997}, DOI={10.1006/jcis.2000.6997}, number={2}, journal={Journal of Colloid and Interface Science}, publisher={Elsevier BV}, author={Richard Bowen, W. and Doneva, Teodora A.}, year={2000}, month=sep, pages={544–549} }