DOI: 10.1006/jcis.1995.1363. Aggregation of IgG on Methylated Silicon Surfaces Studied by Tapping Mode Atomic Force Microscopy

Aggregation of IgG on Methylated Silicon Surfaces Studied by Tapping Mode Atomic Force Microscopy

10.1006/jcis.1995.1363

Crossref journal-article

Elsevier BV

Journal of Colloid and Interface Science (78)

Bibliography

WÃ¤livaara, B., Warkentin, P., LundstrÃ¶m, I., & Tengvall, P. (1995). Aggregation of IgG on Methylated Silicon Surfaces Studied by Tapping Mode Atomic Force Microscopy. Journal of Colloid and Interface Science, 174(1), 53â60.

Authors 4

Bengt Wälivaara (first)
Peter Warkentin (additional)
Ingemar Lundström (additional)
Pentti Tengvall (additional)

References 0 Referenced 19

None

Dates

Type	When
Created	22 years, 10 months ago (Oct. 6, 2002, 3:59 p.m.)
Deposited	6 years, 3 months ago (May 8, 2019, 12:27 a.m.)
Indexed	1 year ago (Aug. 7, 2024, 8:56 p.m.)
Issued	30 years ago (Sept. 1, 1995)
Published	30 years ago (Sept. 1, 1995)
Published Print	30 years ago (Sept. 1, 1995)

Funders 0

None

BibTeX

@article{W_livaara_1995, title={Aggregation of IgG on Methylated Silicon Surfaces Studied by Tapping Mode Atomic Force Microscopy}, volume={174}, ISSN={0021-9797}, url={http://dx.doi.org/10.1006/jcis.1995.1363}, DOI={10.1006/jcis.1995.1363}, number={1}, journal={Journal of Colloid and Interface Science}, publisher={Elsevier BV}, author={Wälivaara, Bengt and Warkentin, Peter and Lundström, Ingemar and Tengvall, Pentti}, year={1995}, month=sep, pages={53–60} }

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