DOI: 10.1002/sia.740110607. Advances in charge neutralization for XPS measurements of nonconducting materials

Advances in charge neutralization for XPS measurements of nonconducting materials

10.1002/sia.740110607

Crossref journal-article

Wiley

Surface and Interface Analysis (311)

Abstract

AbstractThe build‐up of a positive charge during the XPS measurement of nonconducting materials can severely affect the spectral resolution leading to line broadening and time‐dependent energy shifts. The use of a low kinetic energy electron flood gun in conjunction with a metal screen placed in close proximity to the sample surface permits the establishment of a uniform surface potential. The advantages of this approach are demonstrated with spectral data taken from a variety of organic materials. Spectral line widths of 0.9–1.3 eV are routinely obtainable for the C(1s) core level photoelctron signals. Further, the reproducibility obtained on line positions (±0.1 eV) allows the use of a calibration procedure to study the relative line positions between different samples. This combined with better resolution allows a more complete assignment of spectral features including some nearest neighbor effects. A shift between aromatic and aliphatic C(1s) lines is observed.

Bibliography

Barth, G., Linder, R., & Bryson, C. (1988). Advances in charge neutralization for XPS measurements of nonconducting materials. Surface and Interface Analysis, 11(6â7), 307â311. Portico.

Authors 3

G. Barth (first)
R. Linder (additional)
C. Bryson (additional)

References 8 Referenced 150

C. E.BrysonIIIandD. L.Jones Electron Spectroscopy System for Chemical Analysis of Electronically Isolated Specimens Patent #4 680 467.
10.1016/0368-2048(80)85010-9
{'key': 'e_1_2_1_3_2', 'volume-title': 'Handbook of Physics', 'author': 'Smith L. P.', 'year': '1958'} / Handbook of Physics by Smith L. P. (1958)
{'key': 'e_1_2_1_4_2', 'first-page': '266', 'volume-title': 'Introduction to Solid State Physics', 'author': 'Kittel C.', 'year': '1956'} / Introduction to Solid State Physics by Kittel C. (1956)
{'key': 'e_1_2_1_5_2', 'first-page': '303', 'volume-title': 'Practical Surface Analysis by Auger and X‐ray Photoelectron Spectroscopy', 'author': 'Barr T. L.', 'year': '1983'} / Practical Surface Analysis by Auger and X‐ray Photoelectron Spectroscopy by Barr T. L. (1983)
10.1016/0169-4332(86)90001-2
10.1116/1.574108
10.1002/pol.1980.170180103

Dates

Type	When
Created	20 years, 7 months ago (Dec. 30, 2004, 4:44 p.m.)
Deposited	1 year, 11 months ago (Aug. 31, 2023, 8:08 a.m.)
Indexed	2 weeks, 4 days ago (Aug. 6, 2025, 8:21 a.m.)
Issued	37 years, 4 months ago (April 1, 1988)
Published	37 years, 4 months ago (April 1, 1988)
Published Online	20 years, 11 months ago (Sept. 15, 2004)
Published Print	37 years, 4 months ago (April 1, 1988)

Funders 0

None

BibTeX

@article{Barth_1988, title={Advances in charge neutralization for XPS measurements of nonconducting materials}, volume={11}, ISSN={1096-9918}, url={http://dx.doi.org/10.1002/sia.740110607}, DOI={10.1002/sia.740110607}, number={6–7}, journal={Surface and Interface Analysis}, publisher={Wiley}, author={Barth, G. and Linder, R. and Bryson, C.}, year={1988}, month=apr, pages={307–311} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        6
      ]
    ],
    "date-time": "2025-08-06T12:21:26Z",
    "timestamp": 1754482886021
  },
  "reference-count": 8,
  "publisher": "Wiley",
  "issue": "6-7",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2004,
            9,
            15
          ]
        ],
        "date-time": "2004-09-15T00:00:00Z",
        "timestamp": 1095206400000
      },
      "content-version": "vor",
      "delay-in-days": 6011,
      "URL": "http://onlinelibrary.wiley.com/termsAndConditions#vor"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1988,
        4
      ]
    ]
  },
  "abstract": "<jats:title>Abstract</jats:title><jats:p>The build\u2010up of a positive charge during the XPS measurement of nonconducting materials can severely affect the spectral resolution leading to line broadening and time\u2010dependent energy shifts. The use of a low kinetic energy electron flood gun in conjunction with a metal screen placed in close proximity to the sample surface permits the establishment of a uniform surface potential. The advantages of this approach are demonstrated with spectral data taken from a variety of organic materials. Spectral line widths of 0.9\u20131.3 eV are routinely obtainable for the C(1s) core level photoelctron signals. Further, the reproducibility obtained on line positions (\u00b10.1 eV) allows the use of a calibration procedure to study the relative line positions between different samples. This combined with better resolution allows a more complete assignment of spectral features including some nearest neighbor effects. A shift between aromatic and aliphatic C(1s) lines is observed.</jats:p>",
  "DOI": "10.1002/sia.740110607",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2004,
        12,
        30
      ]
    ],
    "date-time": "2004-12-30T21:44:09Z",
    "timestamp": 1104443049000
  },
  "page": "307-311",
  "source": "Crossref",
  "is-referenced-by-count": 150,
  "title": "Advances in charge neutralization for XPS measurements of nonconducting materials",
  "prefix": "10.1002",
  "volume": "11",
  "author": [
    {
      "given": "G.",
      "family": "Barth",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "R.",
      "family": "Linder",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "C.",
      "family": "Bryson",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "311",
  "published-online": {
    "date-parts": [
      [
        2004,
        9,
        15
      ]
    ]
  },
  "reference": [
    {
      "key": "e_1_2_1_1_2",
      "unstructured": "C. E.BrysonIIIandD. L.Jones Electron Spectroscopy System for Chemical Analysis of Electronically Isolated Specimens Patent #4 680 467."
    },
    {
      "key": "e_1_2_1_2_2",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0368-2048(80)85010-9"
    },
    {
      "key": "e_1_2_1_3_2",
      "volume-title": "Handbook of Physics",
      "author": "Smith L. P.",
      "year": "1958"
    },
    {
      "key": "e_1_2_1_4_2",
      "first-page": "266",
      "volume-title": "Introduction to Solid State Physics",
      "author": "Kittel C.",
      "year": "1956"
    },
    {
      "key": "e_1_2_1_5_2",
      "first-page": "303",
      "volume-title": "Practical Surface Analysis by Auger and X\u2010ray Photoelectron Spectroscopy",
      "author": "Barr T. L.",
      "year": "1983"
    },
    {
      "key": "e_1_2_1_6_2",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0169-4332(86)90001-2"
    },
    {
      "key": "e_1_2_1_7_2",
      "doi-asserted-by": "publisher",
      "DOI": "10.1116/1.574108"
    },
    {
      "key": "e_1_2_1_8_2",
      "doi-asserted-by": "publisher",
      "DOI": "10.1002/pol.1980.170180103"
    }
  ],
  "container-title": "Surface and Interface Analysis",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fsia.740110607",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://onlinelibrary.wiley.com/doi/full/10.1002/sia.740110607",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        8,
        31
      ]
    ],
    "date-time": "2023-08-31T12:08:42Z",
    "timestamp": 1693483722000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/sia.740110607"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1988,
        4
      ]
    ]
  },
  "references-count": 8,
  "journal-issue": {
    "issue": "6-7",
    "published-print": {
      "date-parts": [
        [
          1988,
          4
        ]
      ]
    }
  },
  "alternative-id": [
    "10.1002/sia.740110607"
  ],
  "URL": "http://dx.doi.org/10.1002/sia.740110607",
  "relation": {},
  "ISSN": [
    "0142-2421",
    "1096-9918"
  ],
  "subject": [],
  "container-title-short": "Surface &amp; Interface Analysis",
  "published": {
    "date-parts": [
      [
        1988,
        4
      ]
    ]
  }
}