Abstract
AbstractThe occurrence and growth of hummocks on semiconductor surfaces rotated during ion bombardment have been studied. A simple geometrical is proposed which explains why such topographical features may be observed at incident angles of about 65° with respect to the surface normal, whereas they disappear or do not develop at angles of about 80°. It is argued that even microscopic surface undulations with dimensions of the order of 10 nm initiate hummock formation. Finally it is shown that a smooth surface, which can be produced by ion‐milling at grazing incidence, effectively prevents surface tropography development at any angle of incidence.
References
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Dates
Type | When |
---|---|
Created | 20 years, 3 months ago (May 28, 2005, 6:44 a.m.) |
Deposited | 1 year, 10 months ago (Oct. 21, 2023, 2:08 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 4, 2024, 12:01 p.m.) |
Issued | 38 years, 4 months ago (April 1, 1987) |
Published | 38 years, 4 months ago (April 1, 1987) |
Published Online | 20 years, 11 months ago (Sept. 15, 2004) |
Published Print | 38 years, 4 months ago (April 1, 1987) |
@article{Bulle_Lieuwma_1987, title={Suppression of surface topography development in ion‐milling of semiconductors}, volume={10}, ISSN={1096-9918}, url={http://dx.doi.org/10.1002/sia.740100406}, DOI={10.1002/sia.740100406}, number={4}, journal={Surface and Interface Analysis}, publisher={Wiley}, author={Bulle‐Lieuwma, C. W. T. and Zalm, P. C.}, year={1987}, month=apr, pages={210–215} }