Crossref journal-article
Wiley
Surface and Interface Analysis (311)
Abstract

AbstractThe occurrence and growth of hummocks on semiconductor surfaces rotated during ion bombardment have been studied. A simple geometrical is proposed which explains why such topographical features may be observed at incident angles of about 65° with respect to the surface normal, whereas they disappear or do not develop at angles of about 80°. It is argued that even microscopic surface undulations with dimensions of the order of 10 nm initiate hummock formation. Finally it is shown that a smooth surface, which can be produced by ion‐milling at grazing incidence, effectively prevents surface tropography development at any angle of incidence.

Bibliography

Bulle‐Lieuwma, C. W. T., & Zalm, P. C. (1987). Suppression of surface topography development in ion‐milling of semiconductors. Surface and Interface Analysis, 10(4), 210–215. Portico.

Authors 2
  1. C. W. T. Bulle‐Lieuwma (first)
  2. P. C. Zalm (additional)
References 12 Referenced 41
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Dates
Type When
Created 20 years, 3 months ago (May 28, 2005, 6:44 a.m.)
Deposited 1 year, 10 months ago (Oct. 21, 2023, 2:08 p.m.)
Indexed 1 year, 6 months ago (Feb. 4, 2024, 12:01 p.m.)
Issued 38 years, 4 months ago (April 1, 1987)
Published 38 years, 4 months ago (April 1, 1987)
Published Online 20 years, 11 months ago (Sept. 15, 2004)
Published Print 38 years, 4 months ago (April 1, 1987)
Funders 0

None

@article{Bulle_Lieuwma_1987, title={Suppression of surface topography development in ion‐milling of semiconductors}, volume={10}, ISSN={1096-9918}, url={http://dx.doi.org/10.1002/sia.740100406}, DOI={10.1002/sia.740100406}, number={4}, journal={Surface and Interface Analysis}, publisher={Wiley}, author={Bulle‐Lieuwma, C. W. T. and Zalm, P. C.}, year={1987}, month=apr, pages={210–215} }