DOI: 10.1002/sia.2491. Toward a laser assisted wide‐angle tomographic atom‐probe

Toward a laser assisted wide‐angle tomographic atom‐probe

10.1002/sia.2491

Crossref journal-article

Wiley

Surface and Interface Analysis (311)

Abstract

AbstractThis paper reports preliminary results showing that the use of femtosecond laser pulses enables the field evaporation of single atoms, from specimens with a tip‐like shape, without significant specimen heating. It is shown that the field evaporation is assisted by the laser field, which is enhanced by the sub wavelength dimensions of the tip. It is also shown that laser pulsing leads to a high mass resolution, making the use of energy compensating devices in a wide‐angle three‐dimensional atom‐probe ineffectual. In addition, the performances of a position‐sensitive detector that fulfills the wide‐angle 3DAP requirements are presented. The emergence of the third generation of tomographic atom‐probe with (i) wide‐angle analysis capabilities and (ii) a field of application that is extended to poor conductive or insulating materials is then discussed. Copyright © 2007 John Wiley & Sons, Ltd.

Bibliography

Deconihout, B., Vurpillot, F., Gault, B., Da Costa, G., Bouet, M., Bostel, A., Blavette, D., Hideur, A., Martel, G., & Brunel, M. (2007). Toward a laser assisted wideâangle tomographic atomâprobe. Surface and Interface Analysis, 39(2â3), 278â282. Portico.

Authors 10

B. Deconihout (first)
F. Vurpillot (additional)
B. Gault (additional)
G. Da Costa (additional)
M. Bouet (additional)
A. Bostel (additional)
D. Blavette (additional)
A. Hideur (additional)
G. Martel (additional)
M. Brunel (additional)

References 29 Referenced 69

10.1088/0305-4608/8/7/008
10.1063/1.327686
10.1063/1.1137193
10.1063/1.1137930
10.1016/0169-4332(94)90376-X
10.1016/S0304-3991(01)00108-5
10.1016/S0304-3991(96)00064-2
10.1063/1.1304877
10.1016/S0304-3991(02)00322-4
10.1016/S1044-5803(99)00055-8
{'key': 'e_1_2_1_12_2', 'first-page': '1049', 'volume': '55', 'author': 'Liu HF', 'year': '1974', 'journal-title': 'Rev. Sci. Instrum.'} / Rev. Sci. Instrum. by Liu HF (1974)
10.1063/1.1138604
10.1103/PhysRevB.62.2825
10.1103/PhysRevLett.79.645
10.1063/1.118245
10.1063/1.1354655
10.1093/oso/9780198513872.001.0001 / Atom Probe Field Ion Microscopy by Miller MK (1996)
10.1063/1.1871342
10.1063/1.1148477
10.1016/S0304-3991(02)00321-2
10.1063/1.1686295
10.1063/1.1139794
10.1063/1.1144382
10.1016/S0304-3991(97)00164-2
10.1063/1.1305514
10.1016/S0168-9002(01)01876-9
10.1016/0169-4332(94)90370-0
10.1063/1.1829975
10.1088/0022-3727/15/12/025

Dates

Type	When
Created	18 years, 6 months ago (Jan. 23, 2007, 8:59 a.m.)
Deposited	1 year, 6 months ago (Feb. 10, 2024, 6:34 a.m.)
Indexed	3 weeks, 1 day ago (July 30, 2025, 11:17 a.m.)
Issued	18 years, 6 months ago (Jan. 23, 2007)
Published	18 years, 6 months ago (Jan. 23, 2007)
Published Online	18 years, 6 months ago (Jan. 23, 2007)
Published Print	18 years, 6 months ago (Feb. 1, 2007)

Funders 0

None

BibTeX

@article{Deconihout_2007, title={Toward a laser assisted wide‐angle tomographic atom‐probe}, volume={39}, ISSN={1096-9918}, url={http://dx.doi.org/10.1002/sia.2491}, DOI={10.1002/sia.2491}, number={2–3}, journal={Surface and Interface Analysis}, publisher={Wiley}, author={Deconihout, B. and Vurpillot, F. and Gault, B. and Da Costa, G. and Bouet, M. and Bostel, A. and Blavette, D. and Hideur, A. and Martel, G. and Brunel, M.}, year={2007}, month=jan, pages={278–282} }

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