DOI: 10.1002/sia.2490. Towards the three‐dimensional field ion microscope

Towards the three‐dimensional field ion microscope

10.1002/sia.2490

Crossref journal-article

Wiley

Surface and Interface Analysis (311)

Abstract

AbstractThree‐dimensional field ion microscope (FIM) images have been reconstructed using the successive images of an FIM movie. This capability opens a new dimension to the observation with the FIM of various crystallographic features, such as vacancies, dislocations, grain boundaries or precipitates. By piling up the images in a 3D matrix, darkly imaging precipitates in an AlSm alloy are reconstructed in three dimensions. The resolution of the instrument is proved to be better than 0.05 nm in depth and 0.3 nm laterally in favourable cases. This enables a dislocation in Fe to be observed in 3D. Raw reconstructions are, however, slightly distorted. Atomic lines are curved because the basic reconstruction method does not fully take into account the shape of the sample tip. An improved reconstruction method is proposed. Copyright © 2007 John Wiley & Sons, Ltd.

Bibliography

Vurpillot, F., Gilbert, M., & Deconihout, B. (2007). Towards the threeâdimensional field ion microscope. Surface and Interface Analysis, 39(2â3), 273â277. Portico.

Authors 3

F. Vurpillot (first)
M. Gilbert (additional)
B. Deconihout (additional)

References 10 Referenced 34

10.21236/AD0696987 / Field Ion Microscopy: An Introduction to Principles, Experiments and Applications by Müller EW (1969)
10.1093/oso/9780198513872.001.0001 / Atom Probe Field Ion Microscopy by Miller MK (1996)
10.1007/978-1-4615-4281-0
{'issue': '10', 'key': 'e_1_2_1_5_2', 'first-page': '240', 'volume': '18', 'author': 'Deconihout B', 'year': '2002', 'journal-title': 'Rev. Sci. Instrum.'} / Rev. Sci. Instrum. by Deconihout B (2002)
10.1126/science.286.5448.2317
10.1016/S0304-3991(02)00320-0
10.1080/01418618108239544
10.1016/0039-6028(92)91063-H
10.1016/S0304-3991(99)00071-6
10.1063/1.1684616

Dates

Type	When
Created	18 years, 7 months ago (Jan. 23, 2007, 9:37 a.m.)
Deposited	1 year, 6 months ago (Feb. 10, 2024, 6:35 a.m.)
Indexed	1 year, 3 months ago (May 14, 2024, 9:19 p.m.)
Issued	18 years, 7 months ago (Jan. 23, 2007)
Published	18 years, 7 months ago (Jan. 23, 2007)
Published Online	18 years, 7 months ago (Jan. 23, 2007)
Published Print	18 years, 6 months ago (Feb. 1, 2007)

Funders 0

None

BibTeX

@article{Vurpillot_2007, title={Towards the three‐dimensional field ion microscope}, volume={39}, ISSN={1096-9918}, url={http://dx.doi.org/10.1002/sia.2490}, DOI={10.1002/sia.2490}, number={2–3}, journal={Surface and Interface Analysis}, publisher={Wiley}, author={Vurpillot, F. and Gilbert, M. and Deconihout, B.}, year={2007}, month=jan, pages={273–277} }

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