DOI: 10.1002/sia.1492. Phase reconstruction with simultaneous correction of spherical and astigmatic aberrations by three‐dimensional Fourier filtering method

Phase reconstruction with simultaneous correction of spherical and astigmatic aberrations by three‐dimensional Fourier filtering method

10.1002/sia.1492

Crossref journal-article

Wiley

Surface and Interface Analysis (311)

Abstract

AbstractA phase reconstruction technique in transmission electron microscopy (TEM), called the three‐dimensional Fourier filtering method (3D‐FFM), was extended to simultaneous correction of spherical aberration and twofold astigmatism. The effect of the aberration correction was confirmed experimentally for a wide spatial frequency range in the corrected through‐focus images of an amorphous thin film. As an application of this method, the surface structure of a gold nanoparticle was observed. The aberration‐free phase image clearly reconstructed the atomic missing‐row structure at the edge of the particle. Copyright © 2003 John Wiley & Sons, Ltd.

Bibliography

Kawasaki, T., & Takai, Y. (2003). Phase reconstruction with simultaneous correction of spherical and astigmatic aberrations by threeâdimensional Fourier filtering method. Surface and Interface Analysis, 35(1), 51â54. Portico.

Authors 2

Tadahiro Kawasaki (first)
Yoshizo Takai (additional)

References 22 Referenced 6

10.1016/B978-044482051-8/50008-7
10.1016/S0304-3991(01)00088-2
{'key': 'e_1_2_1_4_2', 'first-page': '415', 'volume': '38', 'author': 'Ikuta T', 'year': '1989', 'journal-title': 'J. Electron Microsc.'} / J. Electron Microsc. by Ikuta T (1989)
{'key': 'e_1_2_1_5_2', 'first-page': '103', 'volume': '93', 'author': 'Van Dyck D', 'year': '1993', 'journal-title': 'Optik'} / Optik by Van Dyck D (1993)
10.1016/0304-3991(94)90168-6
10.1016/S0304-3991(01)00122-X
10.1093/jmicro/50.5.405
10.1063/1.1420782
10.1016/S0304-3991(76)91691-0
{'key': 'e_1_2_1_11_2', 'first-page': '155', 'volume': '99', 'author': 'Typke D', 'year': '1995', 'journal-title': 'Optik'} / Optik by Typke D (1995)
10.1016/S0304-3991(99)00163-1
10.1016/S0304-3991(99)00192-8
10.1016/0304-3991(96)00022-8
10.1093/oxfordjournals.jmicro.a023697
10.1078/0030-4026-00012
10.1093/oxfordjournals.jmicro.a023648
{'key': 'e_1_2_1_18_2', 'first-page': '137', 'volume': '39', 'author': 'Taniguchi Y', 'year': '1990', 'journal-title': 'J. Electron Microsc.'} / J. Electron Microsc. by Taniguchi Y (1990)
Van DyckD Op de BeeckM. InProceedings of the 12th International Congress on Electron Microscopy Seattle 1990;26. (10.1017/S0424820100178884)
10.1111/j.1365-2818.1995.tb03586.x
10.1093/oxfordjournals.jmicro.a023759
10.1016/S0920-5861(96)00208-8
10.1093/oxfordjournals.jmicro.a023855

Dates

Type	When
Created	22 years, 7 months ago (Jan. 16, 2003, 4:27 p.m.)
Deposited	1 year, 11 months ago (Sept. 11, 2023, 10 p.m.)
Indexed	1 year, 6 months ago (Feb. 19, 2024, 3:23 p.m.)
Issued	22 years, 8 months ago (Jan. 1, 2003)
Published	22 years, 8 months ago (Jan. 1, 2003)
Published Online	22 years, 7 months ago (Jan. 14, 2003)
Published Print	22 years, 8 months ago (Jan. 1, 2003)

Funders 0

None

BibTeX

@article{Kawasaki_2003, title={Phase reconstruction with simultaneous correction of spherical and astigmatic aberrations by three‐dimensional Fourier filtering method}, volume={35}, ISSN={1096-9918}, url={http://dx.doi.org/10.1002/sia.1492}, DOI={10.1002/sia.1492}, number={1}, journal={Surface and Interface Analysis}, publisher={Wiley}, author={Kawasaki, Tadahiro and Takai, Yoshizo}, year={2003}, month=jan, pages={51–54} }

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