DOI: 10.1002/sca.4950130503. The use of charging effects in Al/Al<sub>2</sub>O<sub>3</sub> metal‐matrix composites as a contrast mechanism in the SEM

The use of charging effects in Al/Al2O3 metal‐matrix composites as a contrast mechanism in the SEM

10.1002/sca.4950130503

Crossref journal-article

Wiley

Scanning (311)

Abstract

AbstractA technique is described to image two phases (alumina and spinel) within a metal‐matrix composite which takes advantage of charging effects that occur during examination in an SEM. Microscope and specimen parameters which affect the amount of contrast generated via charging are discussed, and imaging strategies are introduced to optimize the effect. “Model” metal‐matrix composite specimens were developed to verify the degree of charging in each phase.

Bibliography

Borchert, A. M., Vecchio, K. S., & Stein, R. D. (1991). The use of charging effects in Al/Al2O3 metalâmatrix composites as a contrast mechanism in the SEM. Scanning, 13(5), 344â349. Portico.

Authors 3

A. M. Borchert (first)
K. S. Vecchio (additional)
R. D. Stein (additional)

References 12 Referenced 10

10.1080/00207215908937191
10.1007/978-1-4613-3273-2_10
{'key': 'e_1_2_1_4_1', 'first-page': '159', 'volume-title': 'X‐Ray Optics and Microanalysis, 4th International Congress on X‐Ray Optics and Microanalysis', 'author': 'Heinrich KFJ', 'year': '1966'} / X‐Ray Optics and Microanalysis, 4th International Congress on X‐Ray Optics and Microanalysis by Heinrich KFJ (1966)
10.1007/BF01481739
MortensonA CornieJA FlemingsMC:Status of Current Technology in Metal Matrix Composite Casting. Composite‐Technology: Fifth Annual Conference on Composite‐Technology Carbondale IL (1988)53–64
10.1007/978-1-4757-9027-6_2
{'key': 'e_1_2_1_8_1', 'first-page': '134', 'volume-title': 'The Scanning Electron Microscope, Part I, The Instrument', 'author': 'Oatley CW', 'year': '1972'} / The Scanning Electron Microscope, Part I, The Instrument by Oatley CW (1972)
{'key': 'e_1_2_1_9_1', 'first-page': '153', 'volume-title': 'Charging artifacts in the scanning elecron microscope', 'author': 'Pawley JB', 'year': '1972'} / Charging artifacts in the scanning elecron microscope by Pawley JB (1972)
{'key': 'e_1_2_1_10_1', 'first-page': '121', 'volume-title': 'The ionization function and its application to the electron probe analysis of thin films', 'author': 'Reuter W', 'year': '1966'} / The ionization function and its application to the electron probe analysis of thin films by Reuter W (1966)
{'key': 'e_1_2_1_11_1', 'first-page': '61', 'volume-title': 'Scanning Electron Microscopy, 1976/I', 'author': 'Shaffner TJ', 'year': '1976'} / Scanning Electron Microscopy, 1976/I by Shaffner TJ (1976)
Weast RC Lide DR (Eds):CRC Handbook of Chemistry & Physics. CRC Boca Raton FL (1989)
10.1002/sca.4950110407

Dates

Type	When
Created	14 years ago (Aug. 9, 2011, 12:05 p.m.)
Deposited	1 year, 10 months ago (Oct. 22, 2023, 6:19 p.m.)
Indexed	1 year, 6 months ago (Feb. 7, 2024, 10:11 a.m.)
Issued	34 years, 7 months ago (Jan. 1, 1991)
Published	34 years, 7 months ago (Jan. 1, 1991)
Published Online	14 years ago (Aug. 9, 2011)
Published Print	34 years, 7 months ago (Jan. 1, 1991)

Funders 1

Duralcan USA, San Diego, CA

BibTeX

@article{Borchert_1991, title={The use of charging effects in Al/Al2O3 metal‐matrix composites as a contrast mechanism in the SEM}, volume={13}, ISSN={1932-8745}, url={http://dx.doi.org/10.1002/sca.4950130503}, DOI={10.1002/sca.4950130503}, number={5}, journal={Scanning}, publisher={Wiley}, author={Borchert, A. M. and Vecchio, K. S. and Stein, R. D.}, year={1991}, month=jan, pages={344–349} }

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