DOI: 10.1002/sca.4950020403. Scanning electron microscope observation of single defects in solid crystalline materials

Scanning electron microscope observation of single defects in solid crystalline materials

10.1002/sca.4950020403

Crossref journal-article

Wiley

Scanning (311)

Bibliography

Morin, P., Pitaval, M., Vicario, E., & Fontaine, G. (1979). Scanning electron microscope observation of single defects in solid crystalline materials. Scanning, 2(4), 217â224. Portico.

Authors 4

P. Morin (first)
M. Pitaval (additional)
E. Vicario (additional)
G. Fontaine (additional)

References 8 Referenced 20

10.1039/df9643800298
{'key': 'e_1_2_1_3_1', 'first-page': '613', 'volume-title': 'SEM. Electron channelling defects. Modern Diffraction and Imaging Techniques in Material Science', 'author': 'Booker G R', 'year': '1970'} / SEM. Electron channelling defects. Modern Diffraction and Imaging Techniques in Material Science by Booker G R (1970)
{'key': 'e_1_2_1_4_1', 'first-page': '182', 'volume-title': 'The epitaxy of silicon on sapphire. Electron Microscopy and Analysis', 'author': 'Linington P F', 'year': '1971'} / The epitaxy of silicon on sapphire. Electron Microscopy and Analysis by Linington P F (1971)
10.1080/01418617908234856
{'key': 'e_1_2_1_6_1', 'first-page': '174', 'article-title': 'Effects de contraste crystalline en microscopie électronique à balayage', 'volume': '1', 'author': 'Philibert J', 'year': '1969', 'journal-title': 'Micron'} / Micron / Effects de contraste crystalline en microscopie électronique à balayage by Philibert J (1969)
{'key': 'e_1_2_1_7_1', 'first-page': '185', 'article-title': 'Filtrage en énergie des électrons rétrodiffusés en microscopie électronique à balayage', 'volume': '2', 'author': 'Pitaval M', 'year': '1977', 'journal-title': 'J Microsc Spectrosc Electron'} / J Microsc Spectrosc Electron / Filtrage en énergie des électrons rétrodiffusés en microscopie électronique à balayage by Pitaval M (1977)
10.1080/14786436408217476
10.1063/1.1653899

Dates

Type	When
Created	14 years ago (Aug. 9, 2011, 1:23 p.m.)
Deposited	1 year, 9 months ago (Nov. 7, 2023, 12:53 a.m.)
Indexed	1 year, 2 months ago (June 19, 2024, 1:15 p.m.)
Issued	46 years, 7 months ago (Jan. 1, 1979)
Published	46 years, 7 months ago (Jan. 1, 1979)
Published Online	14 years ago (Aug. 9, 2011)
Published Print	46 years, 7 months ago (Jan. 1, 1979)

Funders 1

Délégation Générale à la „Recherche - Scientificienne et Technique”︁
Awards1
1. 17 CCM

BibTeX

@article{Morin_1979, title={Scanning electron microscope observation of single defects in solid crystalline materials}, volume={2}, ISSN={1932-8745}, url={http://dx.doi.org/10.1002/sca.4950020403}, DOI={10.1002/sca.4950020403}, number={4}, journal={Scanning}, publisher={Wiley}, author={Morin, P. and Pitaval, M. and Vicario, E. and Fontaine, G.}, year={1979}, month=jan, pages={217–224} }

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