Crossref journal-article
Wiley
Scanning (311)
Abstract

SummaryThe helium ion microscope has recently emerged as a commercially available instrument. However, its roots go back more than 60 years to the development of the field ion microscope in Berlin, first reported in 1951. Over the intervening years, numerous researchers have pursued the development of a gas field ionization source with the goal of producing a suitable source for an ion microscope. This proved to be an elusive goal until early in this century when a number of discoveries led to a successful source, and shortly thereafter, an instrument fully able to exploit its advantages. Many individuals and many technical advances have come together to make this new class of microscope. The long history of this quest is reviewed along with the recent advances that led to the achievement of this milestone. A brief summary of the current status of the technology and its applications are given. SCANNING 33: 83–89, 2012. © 2011 Wiley Periodicals, Inc.

Bibliography

Economou, N. P., Notte, J. A., & Thompson, W. B. (2011). The history and development of the helium ion microscope. Scanning, 34(2), 83–89. Portico.

Authors 3
  1. Nicholas P. Economou (first)
  2. John A. Notte (additional)
  3. William B. Thompson (additional)
References 36 Referenced 60
  1. AiharaR.1987. Personal communication with R. Aihara of JEOL.
  2. 10.1116/1.2779049
  3. 10.1016/0039-6028(73)90066-6
  4. 10.1116/1.3237113
  5. 10.1111/j.1365-2818.1988.tb01396.x
  6. CutlerP.2011. Personal communication with Paul Cutler of Pennysylvania State University Department of Physics.
  7. 10.1016/0169-4332(93)90301-Q
  8. 10.1073/pnas.72.5.1826
  9. 10.1147/rd.305.0460
  10. 10.1007/b101190
  11. 10.1116/1.570317
  12. 10.1116/1.571238
  13. 10.1016/0167-5729(94)90007-8
  14. 10.1380/ejssnt.2006.233
  15. 10.1016/0169-4332(95)00351-7
  16. 10.1007/BF01329651
  17. 10.1063/1.1722406
  18. 10.1063/1.1683116
  19. 10.21236/AD0696987 / Field ion microscopy—principles and applications by Müller EW (1969)
  20. 10.1063/1.1713112
  21. {'key': 'e_1_2_8_22_1', 'volume-title': 'The scanning electron microscope', 'author': 'Oatley CW.', 'year': '1972'} / The scanning electron microscope by Oatley CW. (1972)
  22. 10.1116/1.568497
  23. 10.1007/978-1-4615-0765-9
  24. 10.1063/1.1686295
  25. PickardD ScipioniL.2009. Applications note: Graphene nano‐ribbon patterning in the ORION Plus. Carl Zeiss application note available through the web page www.zeiss.com/nts.
  26. 10.1016/j.susc.2008.04.034
  27. 10.1116/1.570323
  28. 10.1063/1.2198536
  29. 10.1088/0950-7671/42/8/341
  30. 10.1017/S1551929500061897 / Microsc Today / Applications of the helium ion microscope by Scipioni L (2007)
  31. 10.1117/12.209185
  32. 10.1116/1.2101792
  33. 10.1017/S1431927610063270
  34. 10.1116/1.2357967
  35. 10.1016/0168-583X(92)95180-Y
  36. 10.1002/adma.201000436
Dates
Type When
Created 14 years, 2 months ago (May 24, 2011, 9:32 a.m.)
Deposited 1 year, 11 months ago (Sept. 12, 2023, 10:16 p.m.)
Indexed 1 month ago (July 16, 2025, 8:27 a.m.)
Issued 14 years, 2 months ago (May 24, 2011)
Published 14 years, 2 months ago (May 24, 2011)
Published Online 14 years, 2 months ago (May 24, 2011)
Published Print 13 years, 5 months ago (March 1, 2012)
Funders 0

None

@article{Economou_2011, title={The history and development of the helium ion microscope}, volume={34}, ISSN={1932-8745}, url={http://dx.doi.org/10.1002/sca.20239}, DOI={10.1002/sca.20239}, number={2}, journal={Scanning}, publisher={Wiley}, author={Economou, Nicholas P. and Notte, John A. and Thompson, William B.}, year={2011}, month=may, pages={83–89} }