DOI: 10.1002/pssa.2211330242. Mechanism of Fatigue in Ferroelectric Thin Films

Mechanism of Fatigue in Ferroelectric Thin Films

10.1002/pssa.2211330242

Crossref journal-article

Wiley

Physica Status Solidi (a) (311)

Bibliography

Yoo, I. K., & Desu, S. B. (1992). Mechanism of Fatigue in Ferroelectric Thin Films. Physica Status Solidi (a), 133(2), 565â573.

Authors 2

I. K. Yoo (first)
S. B. Desu (additional)

References 26 Referenced 165

10.1080/00150197608241388 / Ferroelectrics by Härdtl (1976)
10.1111/j.1151-2916.1973.tb12363.x / J. Amer. Ceram. Soc. by Okazaki (1973)
10.1080/00150197408237980 / Ferroelectrics by Okazaki (1984)
10.1111/j.1151-2916.1970.tb12673.x / J. Amer. Ceram. Soc. by Johnson (1970)
10.1002/pssa.2210590242 / Phys. stat. sol. (a) by Borchhardt (1980)
10.1080/00150197708237124 / Ferroelectrics by Reinecke (1977)
10.1007/BF00550809 / J. Mater. Sci. by Alemany (1984)
10.1063/1.1728890 / J. appl. Phys. by Lehovec (1962)
10.1063/1.331538 / J. appl. Phys. by Loh (1982)
10.1080/00150198608008191 / Ferroelectrics by Neumann (1986)
Proc. 6th Annu. Realiability Phys. Symp. IEEE, California 1968 (p. 257). by Payne (1968)
and , Proc. 4th Internat. Conf. Reliability and Maintainability, May 21 to 25, Rennes-Guirec 1984 (p. 132). by Harmer (1984)
10.1007/BF02396925 / J. Mater. Sci. by Rüdel (1984)
10.1109/TCHMT.1987.1134731 / IEEE Trans. Components, Hybrids, Manuf. Technol. by Yoo (1987)
10.1016/0921-5093(89)90583-2 / Mater. Sci. Engng. A by Waser (1989)
10.1063/1.1709206 / J. appl. Phys. by Taylor (1967)
, and , Piezoelectric Ceramics, Academic Press, New York 1971 (p. 10 to 13, 77, 78). / Piezoelectric Ceramics by Jaffe (1971)
IBM Tech. Report (1955). by Karan (1955)
Physics of Crystalline Dielectrics, Vol. 2, Plenum Press, New York 1971 (pp. 474 to 490). (10.1007/978-1-4615-8984-6) / Physics of Crystalline Dielectrics by Zheludev (1971)
{'key': '10.1002/pssa.2211330242-BIB20', 'first-page': '1589', 'volume': '16', 'author': 'Kudzin', 'year': '1975', 'journal-title': 'Fiz. tverd. Tela'} / Fiz. tverd. Tela by Kudzin (1975)
10.1063/1.346948 / J. appl. Phys. by Duiker (1990)
10.1080/00150198608221431 / Ferroelectrics by Peng (1986)
10.1063/1.350286 / J. appl. Phys. by Scott (1991)
Introduction to Solid State Physics, 5th ed., John Wiley & Sons, Inc., New York 1976 (p. 404). / Introduction to Solid State Physics by Kittel (1976)
and , Principles of Electronic Ceramics, John Wiley & Sons, 1990. / Principles of Electronic Ceramics by Hench (1990)
RT66A Standardized Ferroelectric Test System V2. 1 Operating Manual (1992). (1992)

Dates

Type	When
Created	18 years, 7 months ago (Jan. 12, 2007, 5:36 a.m.)
Deposited	4 years, 1 month ago (July 4, 2021, 12:57 p.m.)
Indexed	2 weeks, 2 days ago (Aug. 5, 2025, 8:27 a.m.)
Issued	32 years, 10 months ago (Oct. 16, 1992)
Published	32 years, 10 months ago (Oct. 16, 1992)
Published Print	32 years, 10 months ago (Oct. 16, 1992)

Funders 0

None

BibTeX

@article{Yoo_1992, title={Mechanism of Fatigue in Ferroelectric Thin Films}, volume={133}, ISSN={1521-396X}, url={http://dx.doi.org/10.1002/pssa.2211330242}, DOI={10.1002/pssa.2211330242}, number={2}, journal={Physica Status Solidi (a)}, publisher={Wiley}, author={Yoo, I. K. and Desu, S. B.}, year={1992}, month=oct, pages={565–573} }

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