Crossref
journal-article
Wiley
Physica Status Solidi (a) (311)
References
10
Referenced
16
- , , , and , Electron Microscopy of Thin Crystals, Butterworths, London-Washington 1965. / Electron Microscopy of Thin Crystals by Hirsch (1965)
- in: Modern Diffraction and Imaging Techniques in Materials Science. Ed. , , and , North-Holland Publ. Co., Amsterdam 1970 (p. 257). / Modern Diffraction and Imaging Techniques in Materials Science. by Amelinckx (1970)
- in: Radiation-Induced Voids in Metals, Ed. and , U.S. Atomic Energy Commission, Oak Ridge, Tennessee 1972 (p. 255). / Radiation-Induced Voids in Metals by Rühle (1972)
10.1098/rspa.1961.0157
/ Proc. Roy. Soc by Howie (1961)10.1002/pssb.19640060331
/ Phys. stat. sol by Wilkens (1964)10.1515/zna-1973-0525
/ Z. Naturf by Wilkens (1973)10.1111/j.1365-2818.1973.tb03816.x
/ J. Microscop by Häussermann (1973)- , and , Phil. Mag., in the press. by Jenkins
- and , Phil. Mag., in the press. by Jenkins
10.1002/pssa.2210380206
/ Phys. stat. sol. (a) by Katerbau (1976)
Dates
Type | When |
---|---|
Created | 18 years, 7 months ago (Jan. 11, 2007, 7:25 p.m.) |
Deposited | 4 years ago (Aug. 7, 2021, 10:52 a.m.) |
Indexed | 1 month, 4 weeks ago (June 25, 2025, 5:07 p.m.) |
Issued | 48 years, 7 months ago (Jan. 16, 1977) |
Published | 48 years, 7 months ago (Jan. 16, 1977) |
Published Print | 48 years, 7 months ago (Jan. 16, 1977) |
@article{Wilkens_1977, title={TEM diffraction contrast of lattice defects causing strain contrast and structure factor contrast simultaneously}, volume={39}, ISSN={1521-396X}, url={http://dx.doi.org/10.1002/pssa.2210390110}, DOI={10.1002/pssa.2210390110}, number={1}, journal={Physica Status Solidi (a)}, publisher={Wiley}, author={Wilkens, M. and Jenkins, M. L. and Katerbau, K.-H.}, year={1977}, month=jan, pages={103–107} }