Crossref
journal-article
Wiley
Progress in Photovoltaics: Research and Applications (311)
References
15
Referenced
1,099
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/ Properties of Silicon by Aspnes D. E. (1988)10.1063/1.356496
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G. E.Jellison Jr.andF. A.Modine Optical Constants for Silicon at 300 K and 10 K Determined from 1.64 to 4.73 eV by Ellipsometry Report ORNL/TM‐8002 Oak Ridge National Laboratory February1982.
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Dates
Type | When |
---|---|
Created | 18 years, 1 month ago (July 12, 2007, 8:22 a.m.) |
Deposited | 1 year, 9 months ago (Oct. 25, 2023, 11:06 p.m.) |
Indexed | 3 days, 19 hours ago (Aug. 21, 2025, 12:48 p.m.) |
Issued | 30 years, 7 months ago (Jan. 1, 1995) |
Published | 30 years, 7 months ago (Jan. 1, 1995) |
Published Online | 18 years, 7 months ago (Jan. 9, 2007) |
Published Print | 30 years, 7 months ago (Jan. 1, 1995) |
@article{Green_1995, title={Optical properties of intrinsic silicon at 300 K}, volume={3}, ISSN={1099-159X}, url={http://dx.doi.org/10.1002/pip.4670030303}, DOI={10.1002/pip.4670030303}, number={3}, journal={Progress in Photovoltaics: Research and Applications}, publisher={Wiley}, author={Green, Martin A. and Keevers, Mark J.}, year={1995}, month=jan, pages={189–192} }