DOI: 10.1002/jemt.22630. Making the practically impossible “Merely difficult”—Cryogenic<scp>FIB</scp>lift‐out for “Damage free” soft matter imaging

Making the practically impossible “Merely difficult”—CryogenicFIBlift‐out for “Damage free” soft matter imaging

10.1002/jemt.22630

Crossref journal-article

Wiley

Microscopy Research and Technique (311)

Abstract

ABSTRACTThe preparation of thinned lamellae from bulk samples for transmission electron microscopy (TEM) analysis has been possible in the focussed ion beam scanning electron microscope (FIB‐SEM) for over 20 years via thein situlift‐out method. Lift‐out offers a fast and site specific preparation method for TEM analysis, typically in the field of materials science. More recently it has been applied to a low‐water content biological sample (Rubino 2012). This work presents the successful lift‐out of high‐water content lamellae, under cryogenic conditions (cryo‐FIB lift‐out) and using a nanomanipulator retaining its full range of motion, which are advances on the work previously done by Rubino (2012). Strategies are explored for maintaining cryogenic conditions, grid attachment using cryo‐condensation of water and protection of the lamella when transferring to the TEM.Microsc. Res. Tech. 79:298–303, 2016. © 2016 Wiley Periodicals, Inc.

Bibliography

Parmenter, C. D. J., Fay, M. W., Hartfield, C., & Eltaher, H. M. (2016). Making the practically impossible âMerely difficultââCryogenicFIBliftâout for âDamage freeâ soft matter imaging. Microscopy Research and Technique, 79(4), 298â303. Portico.

Authors 4

Christopher D.J. Parmenter (first)
Michael W. Fay (additional)
Cheryl Hartfield (additional)
Hoda M. Eltaher (additional)

References 27 Referenced 42

10.1016/j.jsb.2005.01.003
10.1021/nl1032815
AntoniouN GrahamA HartfieldC AmadorG.2012. Conference Proceeding from the 38th International Symposium for Testing and Failure Analysis Phoenix AZ. Nov 11–15 pp. 399‐405. (10.31399/asm.cp.istfa2012p0399)
10.1016/j.jsb.2013.05.016
10.1017/S0033583500004297
10.1111/j.1365-2818.2007.01775.x
10.1016/j.jsb.2010.07.004
10.3934/biophy.2015.2.116
HerlingerLR ChevacharoenkulS ErwinDC.1996Conference Proceeding from the 38th International Symposium for Testing and Failure Analysis Los Angeles CA. pp. 199‐205.
10.1063/1.3698411
10.1016/j.jsb.2013.10.019
10.1046/j.1365-2818.1996.1090666.x
10.1017/S1431927605500709
10.1111/j.1365-2818.2006.01567.x
10.1038/nmeth1014
10.1116/1.586537
10.1016/j.jsb.2010.02.011
10.1073/pnas.1201333109
10.1016/j.jsb.2012.08.012
10.3791/51463
SehrbrockA LenzJ Perez‐WillardF IrsenS.2011. Preparation of a cryo‐TEM lamella by focused ion beam milling IM7.P217. Poster presented September 01 2011 (abstract). Microscopy Conference 2011 Kiel Germany August 28–September 02 2011.
ShaffnerTJ.1997. Abstract 449 Characterization Challenges for the ULSI Era ECS Meeting Abstracts 97‐01. May 4–9 1997 Montreal Quebec Canada pp.563.
10.1111/j.1365-2818.2012.03635.x
10.1046/j.1365-2818.2001.00919.x
10.1111/j.1365-2818.1974.tb03871.x
10.1016/j.sbi.2013.08.006
10.1046/j.1365-2818.2003.01236.x

Dates

Type	When
Created	9 years, 6 months ago (Feb. 15, 2016, 2:24 a.m.)
Deposited	2 months, 2 weeks ago (June 1, 2025, 7:20 a.m.)
Indexed	3 weeks, 4 days ago (July 26, 2025, 5 a.m.)
Issued	9 years, 6 months ago (Feb. 15, 2016)
Published	9 years, 6 months ago (Feb. 15, 2016)
Published Online	9 years, 6 months ago (Feb. 15, 2016)
Published Print	9 years, 4 months ago (April 1, 2016)

Funders 1

the Egyptian Cultural and Educational Bureau (ECEB) in London

BibTeX

@article{Parmenter_2016, title={Making the practically impossible “Merely difficult”—Cryogenic<scp>FIB</scp>lift‐out for “Damage free” soft matter imaging}, volume={79}, ISSN={1097-0029}, url={http://dx.doi.org/10.1002/jemt.22630}, DOI={10.1002/jemt.22630}, number={4}, journal={Microscopy Research and Technique}, publisher={Wiley}, author={Parmenter, Christopher D.J. and Fay, Michael W. and Hartfield, Cheryl and Eltaher, Hoda M.}, year={2016}, month=feb, pages={298–303} }

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