DOI: 10.1002/jemt.20673. A new MEMS‐based system for ultra‐high‐resolution imaging at elevated temperatures

A new MEMS‐based system for ultra‐high‐resolution imaging at elevated temperatures

10.1002/jemt.20673

Crossref journal-article

Wiley

Microscopy Research and Technique (311)

Abstract

AbstractIn recent years, an increasing number of laboratories have been applying in situ heating (and ultimately, gas reaction) techniques in electron microscopy studies of catalysts and other nanophase materials. With the advent of aberration‐corrected electron microscopes that provide sub‐Ångström image resolution, it is of great interest to study the behavior of materials at elevated temperatures while maintaining the resolution capabilities of the microscope. In collaboration with Protochips Inc., our laboratory is developing an advanced capability for in situ heating experiments that overcomes a number of performance problems with standard heating stage technologies. The new heater device allows, for example, temperature cycling from room temperature to greater than 1000°C in 1 ms (a heating rate of 1 million Centigrade degrees per second) and cooling at nearly the same rate. It also exhibits a return to stable operation (drift controlled by the microscope stage, not the heater) in a few seconds after large temperature excursions. With Protochips technology, we were able to demonstrate single atom imaging and the behavior of nanocrystals at high temperatures, using high‐angle annular dark‐field imaging in an aberration‐corrected (S)TEM. The new capability has direct applicability for remote operation and (ultimately) for gas reaction experiments using a specially designed environmental cell. Microsc. Res. Tech., 2009. © 2009 Wiley‐Liss, Inc.

Bibliography

Allard, L. F., Bigelow, W. C., JoseâYacaman, M., Nackashi, D. P., Damiano, J., & Mick, S. E. (2009). A new MEMSâbased system for ultraâhighâresolution imaging at elevated temperatures. Microscopy Research and Technique, 72(3), 208â215. Portico.

Authors 6

Lawrence F. Allard (first)
Wilbur C. Bigelow (additional)
Miguel Jose‐Yacaman (additional)
David P. Nackashi (additional)
John Damiano (additional)
Stephen E. Mick (additional)

References 19 Referenced 144

10.1080/03602457908068055
10.1017/S1431927605508596
10.1017/S1431927608080197
10.1017/S1431927606060570
10.1016/S0304-3991(96)00099-X
10.1116/1.1315784
10.1021/nl070694a
10.1039/b801320a
10.1023/A:1019192523483
10.1023/A:1021333310817 / Top Catal / Developments in in situ environmental cell high‐resolution electron microscopy and applications to catalysis by Gai PL (2002)
10.1007/BF00613537
10.1093/jmicro/dfi071
10.1093/jmicro/dfi072
10.1093/jmicro/dfl032
10.1016/0022-3115(70)90197-2
10.1017/S1431927607077756
10.1557/mrs2008.21
10.1007/S10005-001-0015-1 / Microsc Microanal / Design and applications of environmental cell transmission electron microscope for in situ observations of gas‐solid reactions by Sharma R (2001)
10.1002/(SICI)1097-0029(19980915)42:4<270::AID-JEMT6>3.0.CO;2-U

Dates

Type	When
Created	16 years, 6 months ago (Jan. 22, 2009, 8:32 a.m.)
Deposited	1 year, 11 months ago (Sept. 12, 2023, 12:13 p.m.)
Indexed	29 minutes ago (Aug. 20, 2025, 11:14 p.m.)
Issued	16 years, 6 months ago (Jan. 22, 2009)
Published	16 years, 6 months ago (Jan. 22, 2009)
Published Online	16 years, 6 months ago (Jan. 22, 2009)
Published Print	16 years, 5 months ago (March 1, 2009)

Funders 0

None

BibTeX

@article{Allard_2009, title={A new MEMS‐based system for ultra‐high‐resolution imaging at elevated temperatures}, volume={72}, ISSN={1097-0029}, url={http://dx.doi.org/10.1002/jemt.20673}, DOI={10.1002/jemt.20673}, number={3}, journal={Microscopy Research and Technique}, publisher={Wiley}, author={Allard, Lawrence F. and Bigelow, Wilbur C. and Jose‐Yacaman, Miguel and Nackashi, David P. and Damiano, John and Mick, Stephen E.}, year={2009}, month=jan, pages={208–215} }

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