Abstract
AbstractMeasurements of thickness using electron energy loss spectroscopy (EELS) are revised. Absolute thickness values can be quickly and accurately determined with the Kramers‐Kronig sum method. The EELS data analysis is even much easier with the log‐ratio method, however, absolute calibration of this method requires knowledge of the mean free path of inelastic electron scattering λ. The latter has been measured here in a wide range of solids and a scaling law λ ∼ ρ−0.3 versus mass density ρ has been revealed. EELS measurements critically depend on the excitation and collection angles. This dependence has been studied experimentally and theoretically and an efficient model has been formulated. Microsc. Res. Tech., 2008. © 2008 Wiley‐Liss, Inc.
References
12
Referenced
213
10.1080/13642819008208637
10.1007/978-1-4757-5099-7
10.1016/0304-3991(87)90148-3
10.1103/PhysRevB.77.104102
10.1017/S1431927604881327
10.1016/0304-3991(90)90110-8
10.1093/jmicro/51.3.143
10.1002/jemt.1060080206
10.1111/j.1365-2818.2006.01690.x
10.1093/jmicro/50.1.23
10.1093/jmicro/53.2.137
10.1016/0968-4328(94)00039-S
Dates
Type | When |
---|---|
Created | 17 years, 3 months ago (May 3, 2008, 11:13 p.m.) |
Deposited | 1 year, 9 months ago (Nov. 14, 2023, 5:45 a.m.) |
Indexed | 2 days, 11 hours ago (Aug. 31, 2025, 7:33 p.m.) |
Issued | 17 years, 4 months ago (May 2, 2008) |
Published | 17 years, 4 months ago (May 2, 2008) |
Published Online | 17 years, 4 months ago (May 2, 2008) |
Published Print | 17 years, 1 month ago (Aug. 1, 2008) |
@article{Iakoubovskii_2008, title={Thickness measurements with electron energy loss spectroscopy}, volume={71}, ISSN={1097-0029}, url={http://dx.doi.org/10.1002/jemt.20597}, DOI={10.1002/jemt.20597}, number={8}, journal={Microscopy Research and Technique}, publisher={Wiley}, author={Iakoubovskii, K. and Mitsuishi, K. and Nakayama, Y. and Furuya, K.}, year={2008}, month=may, pages={626–631} }