Crossref journal-article
Wiley
Microscopy Research and Technique (311)
Abstract

AbstractMeasurements of thickness using electron energy loss spectroscopy (EELS) are revised. Absolute thickness values can be quickly and accurately determined with the Kramers‐Kronig sum method. The EELS data analysis is even much easier with the log‐ratio method, however, absolute calibration of this method requires knowledge of the mean free path of inelastic electron scattering λ. The latter has been measured here in a wide range of solids and a scaling law λ ∼ ρ−0.3 versus mass density ρ has been revealed. EELS measurements critically depend on the excitation and collection angles. This dependence has been studied experimentally and theoretically and an efficient model has been formulated. Microsc. Res. Tech., 2008. © 2008 Wiley‐Liss, Inc.

Bibliography

Iakoubovskii, K., Mitsuishi, K., Nakayama, Y., & Furuya, K. (2008). Thickness measurements with electron energy loss spectroscopy. Microscopy Research and Technique, 71(8), 626–631. Portico.

Dates
Type When
Created 17 years, 3 months ago (May 3, 2008, 11:13 p.m.)
Deposited 1 year, 9 months ago (Nov. 14, 2023, 5:45 a.m.)
Indexed 2 days, 11 hours ago (Aug. 31, 2025, 7:33 p.m.)
Issued 17 years, 4 months ago (May 2, 2008)
Published 17 years, 4 months ago (May 2, 2008)
Published Online 17 years, 4 months ago (May 2, 2008)
Published Print 17 years, 1 month ago (Aug. 1, 2008)
Funders 0

None

@article{Iakoubovskii_2008, title={Thickness measurements with electron energy loss spectroscopy}, volume={71}, ISSN={1097-0029}, url={http://dx.doi.org/10.1002/jemt.20597}, DOI={10.1002/jemt.20597}, number={8}, journal={Microscopy Research and Technique}, publisher={Wiley}, author={Iakoubovskii, K. and Mitsuishi, K. and Nakayama, Y. and Furuya, K.}, year={2008}, month=may, pages={626–631} }