DOI: 10.1002/jemt.20494. Surface damage induced by FIB milling and imaging of biological samples is controllable

Surface damage induced by FIB milling and imaging of biological samples is controllable

10.1002/jemt.20494

Crossref journal-article

Wiley

Microscopy Research and Technique (311)

Abstract

AbstractFocused ion beam (FIB) techniques are among the most important tools for the nanostructuring of surfaces. We used the FIB/SEM (scanning electron microscope) for milling and imaging of digestive gland cells. The aim of our study was to document the interactions of FIB with the surface of the biological sample during FIB investigation, to identify the classes of artifacts, and to test procedures that could induce the quality of FIB milled sections by reducing the artifacts. The digestive gland cells were prepared for conventional SEM. During FIB/SEM operation we induced and enhanced artifacts. The results show that FIB operation on biological tissue affected the area of the sample where ion beam was rastering. We describe the FIB‐induced surface major artifacts as a melting‐like effect, sweating‐like effect, morphological deformations, and gallium (Ga+) implantation. The FIB induced surface artifacts caused by incident Ga+ ions were reduced by the application of a protective platinum strip on the surface exposed to the beam and by a suitable selection of operation protocol. We recommend the same sample preparation methods, FIB protocol for milling and imaging to be used also for other biological samples. Microsc. Res. Tech., 2007. © 2007 Wiley‐Liss, Inc.

Bibliography

Drobne, D., Milani, M., LeÅ¡er, V., & Tatti, F. (2007). Surface damage induced by FIB milling and imaging of biological samples is controllable. Microscopy Research and Technique, 70(10), 895â903. Portico.

Authors 4

Damjana Drobne (first)
Marziale Milani (additional)
Vladka Lešer (additional)
Francesco Tatti (additional)

References 57 Referenced 70

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Dates

Type	When
Created	18 years ago (July 27, 2007, 3:46 p.m.)
Deposited	1 year, 9 months ago (Nov. 14, 2023, 1:29 p.m.)
Indexed	1 year ago (Aug. 12, 2024, 12:35 p.m.)
Issued	18 years, 1 month ago (July 27, 2007)
Published	18 years, 1 month ago (July 27, 2007)
Published Online	18 years, 1 month ago (July 27, 2007)
Published Print	17 years, 10 months ago (Oct. 1, 2007)

Funders 0

None

BibTeX

@article{Drobne_2007, title={Surface damage induced by FIB milling and imaging of biological samples is controllable}, volume={70}, ISSN={1097-0029}, url={http://dx.doi.org/10.1002/jemt.20494}, DOI={10.1002/jemt.20494}, number={10}, journal={Microscopy Research and Technique}, publisher={Wiley}, author={Drobne, Damjana and Milani, Marziale and Lešer, Vladka and Tatti, Francesco}, year={2007}, month=jul, pages={895–903} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        8,
        12
      ]
    ],
    "date-time": "2024-08-12T16:35:14Z",
    "timestamp": 1723480514913
  },
  "reference-count": 57,
  "publisher": "Wiley",
  "issue": "10",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2007,
            7,
            27
          ]
        ],
        "date-time": "2007-07-27T00:00:00Z",
        "timestamp": 1185494400000
      },
      "content-version": "vor",
      "delay-in-days": 0,
      "URL": "http://onlinelibrary.wiley.com/termsAndConditions#vor"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2007,
        10
      ]
    ]
  },
  "abstract": "<jats:title>Abstract</jats:title><jats:p>Focused ion beam (FIB) techniques are among the most important tools for the nanostructuring of surfaces. We used the FIB/SEM (scanning electron microscope) for milling and imaging of digestive gland cells. The aim of our study was to document the interactions of FIB with the surface of the biological sample during FIB investigation, to identify the classes of artifacts, and to test procedures that could induce the quality of FIB milled sections by reducing the artifacts. The digestive gland cells were prepared for conventional SEM. During FIB/SEM operation we induced and enhanced artifacts. The results show that FIB operation on biological tissue affected the area of the sample where ion beam was rastering. We describe the FIB\u2010induced surface major artifacts as a melting\u2010like effect, sweating\u2010like effect, morphological deformations, and gallium (Ga<jats:sup>+</jats:sup>) implantation. The FIB induced surface artifacts caused by incident Ga<jats:sup>+</jats:sup> ions were reduced by the application of a protective platinum strip on the surface exposed to the beam and by a suitable selection of operation protocol. We recommend the same sample preparation methods, FIB protocol for milling and imaging to be used also for other biological samples. Microsc. Res. Tech., 2007. \u00a9 2007 Wiley\u2010Liss, Inc.</jats:p>",
  "DOI": "10.1002/jemt.20494",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2007,
        7,
        27
      ]
    ],
    "date-time": "2007-07-27T19:46:43Z",
    "timestamp": 1185565603000
  },
  "page": "895-903",
  "source": "Crossref",
  "is-referenced-by-count": 70,
  "title": "Surface damage induced by FIB milling and imaging of biological samples is controllable",
  "prefix": "10.1002",
  "volume": "70",
  "author": [
    {
      "given": "Damjana",
      "family": "Drobne",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Marziale",
      "family": "Milani",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Vladka",
      "family": "Le\u0161er",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Francesco",
      "family": "Tatti",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "311",
  "published-online": {
    "date-parts": [
      [
        2007,
        7,
        27
      ]
    ]
  },
  "reference": [
    {
      "key": "e_1_2_1_2_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/j.apsusc.2005.06.013"
    },
    {
      "key": "e_1_2_1_3_1",
      "doi-asserted-by": "crossref",
      "first-page": "109",
      "DOI": "10.1515/pm-2003-400302",
      "article-title": "Experiences in cross section preparation of layered materials by FIB\u2010method",
      "volume": "40",
      "author": "Arnold B",
      "year": "2003",
      "journal-title": "Prakt Metallogr\u2010Pr M"
    },
    {
      "key": "e_1_2_1_4_1",
      "first-page": "89",
      "article-title": "Life science applications of focused ion beams (FIB)",
      "volume": "4",
      "author": "Ballerini M",
      "year": "1997",
      "journal-title": "Eur J Histochem"
    },
    {
      "key": "e_1_2_1_5_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(93)90025-S"
    },
    {
      "key": "e_1_2_1_6_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0968-4328(99)00011-6"
    },
    {
      "key": "e_1_2_1_7_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.351658"
    },
    {
      "key": "e_1_2_1_8_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0168-583X(01)00334-2"
    },
    {
      "key": "e_1_2_1_9_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S1386-9477(03)00330-8"
    },
    {
      "key": "e_1_2_1_10_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0968-4328(03)00007-6"
    },
    {
      "key": "e_1_2_1_11_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S1359-6462(99)00374-7"
    },
    {
      "key": "e_1_2_1_12_1",
      "doi-asserted-by": "crossref",
      "first-page": "452",
      "DOI": "10.1007/S100050010048",
      "article-title": "Transmission electron microscope specimen preparation of metal matrix composites using the focused ion beam miller",
      "volume": "6",
      "author": "Cairney JM",
      "year": "2000",
      "journal-title": "Microsc Microanal"
    },
    {
      "key": "e_1_2_1_13_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0043-1648(01)00898-5"
    },
    {
      "key": "e_1_2_1_14_1",
      "first-page": "139",
      "article-title": "A summary of ion beam etching of biological material with special reference to the saddle field source",
      "author": "Claugher D",
      "year": "1986",
      "journal-title": "Scan Electron Microsc"
    },
    {
      "key": "e_1_2_1_15_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1117/1.1803846"
    },
    {
      "key": "e_1_2_1_16_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1002/sca.4950270106"
    },
    {
      "key": "e_1_2_1_17_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1111/j.1365-2818.2005.01490.x"
    },
    {
      "key": "e_1_2_1_18_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0378-5955(95)00155-9"
    },
    {
      "key": "e_1_2_1_19_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1007/s00339-002-1943-1"
    },
    {
      "key": "e_1_2_1_20_1",
      "first-page": "379",
      "article-title": "Ion etching of organic materials",
      "author": "Fulker MJ",
      "year": "1973",
      "journal-title": "Scan Electron Microsc"
    },
    {
      "key": "e_1_2_1_21_1",
      "first-page": "151",
      "article-title": "Contribution of scanning electron microscopy to viewing internal cell structure",
      "author": "Haggis GH",
      "year": "1982",
      "journal-title": "Scan Electron Microsc"
    },
    {
      "key": "e_1_2_1_22_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1046/j.1365-2818.2003.01216.x"
    },
    {
      "key": "e_1_2_1_23_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1111/j.0022-2720.2004.01376.x"
    },
    {
      "key": "e_1_2_1_24_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/1742-6596/26/1/052"
    },
    {
      "key": "e_1_2_1_25_1",
      "first-page": "110",
      "article-title": "Focused\u2010ion\u2010beam digging of biological specimens",
      "volume": "44",
      "author": "Ishitani T",
      "year": "1995",
      "journal-title": "J Electron Microsc"
    },
    {
      "key": "e_1_2_1_26_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1116/1.590106"
    },
    {
      "key": "e_1_2_1_27_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1093/jmicro/dfh078"
    },
    {
      "key": "e_1_2_1_28_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1093/jmicro/dfh080"
    },
    {
      "key": "e_1_2_1_29_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1038/220614a0"
    },
    {
      "key": "e_1_2_1_30_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1007/s11837-006-0156-z"
    },
    {
      "key": "e_1_2_1_31_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1038/35084037"
    },
    {
      "key": "e_1_2_1_32_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0168-583X(95)00778-4"
    },
    {
      "key": "e_1_2_1_33_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0304-3991(00)00096-6"
    },
    {
      "key": "e_1_2_1_34_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1002/sca.4950280303"
    },
    {
      "key": "e_1_2_1_35_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1002/imic.200790093"
    },
    {
      "key": "e_1_2_1_36_1",
      "volume-title": "An atlas of FBI/SEM applications in soft materials and life sciences, (A05, 16)",
      "author": "Milani M",
      "year": "2006"
    },
    {
      "key": "e_1_2_1_37_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0168-583X(97)00028-1"
    },
    {
      "key": "e_1_2_1_38_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1103/PhysRevB.65.165329"
    },
    {
      "key": "e_1_2_1_39_1",
      "first-page": "324",
      "article-title": "The development of field\u2010emission scanning electron microscopy for imaging biological surfaces",
      "volume": "19",
      "author": "Pawley J",
      "year": "1997",
      "journal-title": "Scanning"
    },
    {
      "key": "e_1_2_1_40_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1111/j.0022-2720.2004.01325.x"
    },
    {
      "key": "e_1_2_1_41_1",
      "unstructured": "PhaneufM LiJ ShumanRF NollK CasyJD.2003. Apparatus and method for reducing differential sputter rates. US Pat no. 6 641 705. Available atwww.freepatentsonline.com/6641705.html"
    },
    {
      "key": "e_1_2_1_42_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1093/jmicro/52.3.291"
    },
    {
      "key": "e_1_2_1_43_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0168-583X(02)01874-8"
    },
    {
      "key": "e_1_2_1_44_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1017/S1431927602010097"
    },
    {
      "key": "e_1_2_1_45_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/j.microrel.2004.07.073"
    },
    {
      "key": "e_1_2_1_46_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0167-577X(02)01202-8"
    },
    {
      "key": "e_1_2_1_47_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1111/j.0022-2720.2004.01327.x"
    },
    {
      "key": "e_1_2_1_48_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1017/S1431927605050294"
    },
    {
      "key": "e_1_2_1_49_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0169-4332(98)00773-9"
    },
    {
      "key": "e_1_2_1_50_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/j.cemconcomp.2004.02.029"
    },
    {
      "key": "e_1_2_1_51_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1038/247061a0"
    },
    {
      "key": "e_1_2_1_52_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.1489069"
    },
    {
      "key": "e_1_2_1_53_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1017/S1431927606060041"
    },
    {
      "key": "e_1_2_1_54_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0167-9317(94)00120-J"
    },
    {
      "key": "e_1_2_1_55_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/j.apsusc.2004.09.092"
    },
    {
      "key": "e_1_2_1_56_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1093/jmicro/dfh062"
    },
    {
      "key": "e_1_2_1_57_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1002/jemt.1060120110"
    },
    {
      "key": "e_1_2_1_58_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/j.matlet.2005.08.018"
    }
  ],
  "container-title": "Microscopy Research and Technique",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fjemt.20494",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://onlinelibrary.wiley.com/doi/full/10.1002/jemt.20494",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        11,
        14
      ]
    ],
    "date-time": "2023-11-14T18:29:45Z",
    "timestamp": 1699986585000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/jemt.20494"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2007,
        7,
        27
      ]
    ]
  },
  "references-count": 57,
  "journal-issue": {
    "issue": "10",
    "published-print": {
      "date-parts": [
        [
          2007,
          10
        ]
      ]
    }
  },
  "alternative-id": [
    "10.1002/jemt.20494"
  ],
  "URL": "http://dx.doi.org/10.1002/jemt.20494",
  "relation": {},
  "ISSN": [
    "1059-910X",
    "1097-0029"
  ],
  "subject": [],
  "container-title-short": "Microscopy Res &amp; Technique",
  "published": {
    "date-parts": [
      [
        2007,
        7,
        27
      ]
    ]
  }
}