DOI: 10.1002/jemt.1070200404. Recent studies of surface dynamic processes by reflection electron microscopy

Recent studies of surface dynamic processes by reflection electron microscopy

10.1002/jemt.1070200404

Crossref journal-article

Wiley

Microscopy Research and Technique (311)

Abstract

AbstractReflection electron microscope studies of surface dynamic processes are reviewed and illustrated with recent new observations. They include: surface electromigration and current dependent structures of Si surfaces; surface etching by oxidation of Si surface; and growth of two dimensional alloyed adsorbate by co‐deposition of metals on Si surface. The observations revealed details of the surface dynamic processes, which are difficult to obtain with other surface analysis techniques.

Bibliography

Yagi, K., Yamanaka, A., & Homma, I. (1992). Recent studies of surface dynamic processes by reflection electron microscopy. Microscopy Research and Technique, 20(4), 333â340. Portico.

Authors 3

Katsumichi Yagi (first)
Akira Yamanaka (additional)
Itsuro Homma (additional)

References 37 Referenced 8

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10.1007/978-1-4615-9537-3_9
10.1088/0508-3443/11/4/304
Homma I. Tanishiro Y. andYagi K.(1991)REM and TEM studies of 2D Au‐Cu alloy adsorbate on Si(111) surface. Proceedings of the 16th Yamada Conference “Surface as a New Material ” Osaka July 1990. Surface Sci. 242:81. (10.1016/0039-6028(91)90246-O)
Ichikawa M. andDoi T.(1989)Observations of electromigration effect upon Si‐MBE growth on Si(001) surface: Read at the 7th International Conference on Surface Science Korn September. (10.1016/0042-207X(90)93826-5)
10.1007/978-1-4684-5580-9_1
10.1143/JJAP.26.L293
Ishizuka T. Takayanagi K. Tanishiro Y. andYagi K.(1986)Reflection and transmission electron microscopy and diffraction studies of Cu condensation on Si(111)7×7 reconstructed surface. Proceedings of the 11th International Conference on Electron Microscopy Kyoto 1986 vol.2 p1347.
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10.1016/0039-6028(83)90537-X
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Shima M. Kobayashi K. Tanishiro Y. andYagi K.(1991)REM study of Si growth on Si. J. Cryst. Growth.(in press).
10.1016/0304-3991(85)90165-2
{'key': 'e_1_2_1_25_1', 'first-page': '441', 'article-title': 'Techniques for routine UHV in‐situ electron microscopy of growth processes of epitaxial thin films', 'volume': '11', 'author': 'Takayanagi K.', 'year': '1978', 'journal-title': 'J. Phys.'} / J. Phys. / Techniques for routine UHV in‐situ electron microscopy of growth processes of epitaxial thin films by Takayanagi K. (1978)
10.1016/0304-3991(89)90030-2
10.1111/j.1365-2818.1986.tb02758.x
10.1016/0039-6028(90)90662-R
10.1107/S0021889887086916
{'key': 'e_1_2_1_30_1', 'volume-title': 'In: High Resolution Electron Microscopy', 'author': 'Yagi K.', 'year': '1989'} / In: High Resolution Electron Microscopy by Yagi K. (1989)
{'key': 'e_1_2_1_31_1', 'volume-title': 'In: Electron Diffraction Techniques', 'author': 'Yagi K.', 'year': '1992'} / In: Electron Diffraction Techniques by Yagi K. (1992)
10.1007/978-1-4684-5580-9_21
{'key': 'e_1_2_1_33_1', 'first-page': '47', 'volume-title': 'Crystals, Growth, Properties and Applications', 'author': 'Yagi K.', 'year': '1982'} / Crystals, Growth, Properties and Applications by Yagi K. (1982)
Yamanaka A. Tanishiro Y. andYagi K.(1991a)Surface electromigration of Au on Si surfaces studied by REM. Surface Sci. (in press). (10.1007/978-3-642-84482-9_24)
{'key': 'e_1_2_1_35_1', 'first-page': '502', 'volume-title': 'Structure of Surfaces III', 'author': 'Yamanaka A.', 'year': '1991'} / Structure of Surfaces III by Yamanaka A. (1991)
Yamanaka A. andYagi K.(1991)Surface electromigration of In and Cu on Si(111) surfaces studied by REM. In: Proceedings of the 26th Yamada Conference “Surface as a New Material ” Osaka July 1990. Surface Sci. 242:181. (10.1016/0039-6028(91)90263-R)
10.1016/0304-3991(89)90242-8
10.1016/0040-6090(82)90278-4

Dates

Type	When
Created	20 years, 6 months ago (Feb. 23, 2005, 5:50 p.m.)
Deposited	1 year, 10 months ago (Oct. 23, 2023, 7:19 p.m.)
Indexed	1 year, 10 months ago (Oct. 24, 2023, 7:42 a.m.)
Issued	33 years, 6 months ago (Feb. 15, 1992)
Published	33 years, 6 months ago (Feb. 15, 1992)
Published Online	20 years, 6 months ago (Feb. 4, 2005)
Published Print	33 years, 6 months ago (Feb. 15, 1992)

Funders 0

None

BibTeX

@article{Yagi_1992, title={Recent studies of surface dynamic processes by reflection electron microscopy}, volume={20}, ISSN={1097-0029}, url={http://dx.doi.org/10.1002/jemt.1070200404}, DOI={10.1002/jemt.1070200404}, number={4}, journal={Microscopy Research and Technique}, publisher={Wiley}, author={Yagi, Katsumichi and Yamanaka, Akira and Homma, Itsuro}, year={1992}, month=feb, pages={333–340} }

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