DOI: 10.1002/jemt.1060020610. Electron beam radiation damage to organic inclusions in ice as an analytical tool for polymer science

Electron beam radiation damage to organic inclusions in ice as an analytical tool for polymer science

10.1002/jemt.1060020610

Crossref journal-article

Wiley

Journal of Electron Microscopy Technique (311)

Abstract

AbstractA method is proposed to enhance contrast between microdomains of two‐component polymer systems using electron beam radiation damage. The technique is based on the different damage patterns to crosslinking‐type and scission‐type polymer particles embedded in ice. Whereas the former lose little mass and cavities form in the ice around them, the latter lose much more mass, become cellular in appearance, and occasionally swell. Applications of the technique are demonstrated by revealing the microstructure of two‐stage poly(butylacrylate)/polystyrene latices, their size distributions, and the presence of single‐component particles in the two‐component system.

Bibliography

Talmon, Y., Narkis, M., & Silverstein, M. (1985). Electron beam radiation damage to organic inclusions in ice as an analytical tool for polymer science. Journal of Electron Microscopy Technique, 2(6), 589â596. Portico.

Authors 3

Yeshayahu Talmon (first)
Moshe Narkis (additional)
Michael Silverstein (additional)

References 12 Referenced 16

{'key': 'e_1_2_1_2_1', 'volume-title': 'Radiation Chemistry of Polymeric Systems', 'author': 'Chapiro A.', 'year': '1962'} / Radiation Chemistry of Polymeric Systems by Chapiro A. (1962)
10.1002/app.1973.070170105
Falls A. H.(1982)Electron microscopy and molecular theory of microstructured fluidsPh.D. Thesis University of Minnesota.
10.1016/0005-2736(82)90444-8
10.1002/pol.1967.150050509
Narkis M. Talmon Y. andSilverstein M.(1985) Properties and structure of elastometric two‐stage emulsion interpenetrating networks.Polymer in press. (10.1016/0032-3861(85)90312-X)
10.1016/0304-3991(83)90007-4
10.1016/0304-3991(84)90098-6
10.1063/1.1135920
Talmon Y. Adrian M. andDubochet J.(1985) Electron beam radiation damage to organic inclusions in vitreous cubic and hexagonal ice.J. Microsc in press. (10.1002/jemt.1060020610)
10.1016/0032-3861(78)90044-7
10.1002/pen.760240205

Dates

Type	When
Created	20 years, 6 months ago (Feb. 24, 2005, 4:36 a.m.)
Deposited	1 year, 10 months ago (Oct. 19, 2023, 7:35 p.m.)
Indexed	1 year, 1 month ago (July 14, 2024, 8:50 p.m.)
Issued	40 years, 8 months ago (Jan. 1, 1985)
Published	40 years, 8 months ago (Jan. 1, 1985)
Published Online	20 years, 6 months ago (Feb. 4, 2005)
Published Print	40 years, 8 months ago (Jan. 1, 1985)

Funders 0

None

BibTeX

@article{Talmon_1985, title={Electron beam radiation damage to organic inclusions in ice as an analytical tool for polymer science}, volume={2}, ISSN={1553-0817}, url={http://dx.doi.org/10.1002/jemt.1060020610}, DOI={10.1002/jemt.1060020610}, number={6}, journal={Journal of Electron Microscopy Technique}, publisher={Wiley}, author={Talmon, Yeshayahu and Narkis, Moshe and Silverstein, Michael}, year={1985}, month=jan, pages={589–596} }

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