DOI: 10.1002/ijch.201000052. Quantifying the Stacking Registry Matching in Layered Materials

Quantifying the Stacking Registry Matching in Layered Materials

10.1002/ijch.201000052

Crossref journal-article

Wiley

Israel Journal of Chemistry (311)

Abstract

AbstractA detailed account of a recently developed method [Marom et al., Phys. Rev. Lett. 2010, 105, 046801] to quantify the registry mismatch in layered materials is presented. The registry index, which was originally defined for planar hexagonal boron‐nitride, is extended to treat graphitic systems and generalized to describe multi‐layered nanotubes. It is shown that, using simple geometric considerations, it is possible to capture the complex physical features of interlayer sliding in layered materials. The intuitive nature of the presented model and the efficiency of the related computations suggest that the method can be used as a powerful characterization tool for interlayer interactions in complex layered systems.

Bibliography

Hod, O. (2010). Quantifying the Stacking Registry Matching in Layered Materials. Israel Journal of Chemistry, 50(4), 506â514. Portico.

Authors 1

Oded Hod (first)

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Dates

Type	When
Created	14 years, 9 months ago (Nov. 3, 2010, 12:22 a.m.)
Deposited	1 year, 11 months ago (Sept. 12, 2023, 3:22 a.m.)
Indexed	4 weeks ago (July 26, 2025, 5:16 a.m.)
Issued	14 years, 10 months ago (Oct. 1, 2010)
Published	14 years, 10 months ago (Oct. 1, 2010)
Published Online	14 years, 9 months ago (Nov. 2, 2010)
Published Print	14 years, 10 months ago (Oct. 1, 2010)

Funders 0

None

BibTeX

@article{Hod_2010, title={Quantifying the Stacking Registry Matching in Layered Materials}, volume={50}, ISSN={1869-5868}, url={http://dx.doi.org/10.1002/ijch.201000052}, DOI={10.1002/ijch.201000052}, number={4}, journal={Israel Journal of Chemistry}, publisher={Wiley}, author={Hod, Oded}, year={2010}, month=oct, pages={506–514} }

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