Crossref journal-article
Wiley
ChemPhysChem (311)
Abstract

AbstractThe present status of in‐situ scanning transmission X‐ray microscopy (STXM) is reviewed, with an emphasis on the abilities of the STXM technique in comparison with electron microscopy. The experimental aspects and interpretation of X‐ray absorption spectroscopy (XAS) are briefly introduced and the experimental boundary conditions that determine the potential applications for in‐situ XAS and in‐situ STXM studies are discussed. Nanoscale chemical imaging of catalysts under working conditions is outlined using cobalt and iron Fischer–Tropsch catalysts as showcases. In the discussion, we critically compare STXM‐XAS and STEM‐EELS (scanning transmission electron microscopy–electron energy loss spectroscopy) measurements and indicate some future directions of in‐situ nanoscale imaging of catalytic solids and related nanomaterials.

Bibliography

de Groot, F. M. F., de Smit, E., van Schooneveld, M. M., Aramburo, L. R., & Weckhuysen, B. M. (2010). In‐situ Scanning Transmission X‐Ray Microscopy of Catalytic Solids and Related Nanomaterials. ChemPhysChem, 11(5), 951–962. Portico.

Authors 5
  1. Frank M. F. de Groot (first)
  2. Emiel de Smit (additional)
  3. Matti M. van Schooneveld (additional)
  4. Luis R. Aramburo (additional)
  5. Bert M. Weckhuysen (additional)
References 75 Referenced 124
  1. 10.1002/ange.200900339
  2. 10.1002/anie.200900339
  3. 10.1038/nature04502
  4. 10.1016/S0368-2048(97)00013-3
  5. 10.1051/jp4:200300037
  6. 10.1063/1.3021472
  7. 10.1016/j.nima.2007.08.083
  8. 10.1107/S0909049597014283
  9. 10.1107/S0909049502005502
  10. F. de Groot XASEELS website www.anorg.chem.uu.nl/people/staff/FrankdeGroot/xaseels.htm.2010 3.
  11. 10.1016/S0167-5729(97)00011-3
  12. 10.1126/science.1439809
  13. 10.1021/jp0403846
  14. 10.1201/9781420008425
  15. 10.1021/ja00021a018
  16. 10.1016/j.ccr.2004.03.018
  17. 10.1021/ja061802i
  18. 10.1021/ja034634s
  19. 10.1021/jp034125c
  20. 10.1021/jp802915k
  21. 10.1016/j.elspec.2009.04.010
  22. 10.1016/0038-1098(94)90027-2
  23. 10.1063/1.1138464
  24. 10.1021/jp013281l
  25. 10.1021/la9804132
  26. 10.1016/j.carbon.2004.08.029
  27. 10.1038/nature03719
  28. 10.1107/S0909049502017739
  29. {'key': 'e_1_2_8_28_2', 'volume-title': 'Principles and Applications of Zone Plate X‐Ray Microscopes in The Science of Microscopy', 'author': 'Howells M.', 'year': '2007'} / Principles and Applications of Zone Plate X‐Ray Microscopes in The Science of Microscopy by Howells M. (2007)
  30. 10.1111/j.1472-4669.2009.00211.x
  31. 10.1016/S0168-9002(01)00517-4
  32. 10.1016/j.nima.2008.12.157
  33. 10.1016/S0360-0564(08)00004-7
  34. 10.1103/PhysRevLett.103.110801
  35. 10.1016/j.ultramic.2009.05.002
  36. 10.1016/j.ultramic.2008.04.014
  37. 10.1016/j.ultramic.2008.05.012
  38. 10.1051/mmm:1995115
  39. 10.1016/j.micron.2007.09.010
  40. 10.1016/S0368-2048(97)00016-9
  41. 10.1063/1.1150023
  42. 10.1088/0034-4885/57/9/002
  43. 10.1038/nature00972
  44. 10.1038/nmat2380
  45. 10.1126/science.1148820
  46. M. P. Seah W. A. Dench Quantitative Electron Spectroscopy of Surfaces: A Standard Data Base for Electron Inelastic Mean Free Paths in Solids Surface and Interface Anal. 1 2 1979. (10.1002/sia.740010103)
  47. 10.1364/OE.17.017669
  48. {'key': 'e_1_2_8_47_2', 'first-page': '5', 'volume': '19', 'author': 'Chen Y. T.', 'year': '2008', 'journal-title': 'Nanotechnology'} / Nanotechnology by Chen Y. T. (2008)
  49. 10.1016/j.cattod.2008.11.002
  50. 10.1002/ange.200703673
  51. 10.1002/anie.200703673
  52. 10.1021/ja907329j
  53. 10.1002/(SICI)1521-3757(19980703)110:13/14<2049::AID-ANGE2049>3.0.CO;2-H
  54. 10.1002/(SICI)1521-3773(19980803)37:13/14<1939::AID-ANIE1939>3.0.CO;2-T
  55. 10.1039/b306130m
  56. 10.1039/b920256k
  57. 10.1002/marc.200300178
  58. 10.1002/1521-4095(200012)12:23<1809::AID-ADMA1809>3.0.CO;2-B
  59. 10.1063/1.1791320
  60. I. Swart E. de Smit B. M. Weckhuysen F. M. F. de Groot unpublished results 2007.
  61. 10.1038/nature07516
  62. 10.1002/ange.200806003
  63. 10.1002/anie.200806003
  64. 10.1021/jp901528g
  65. 10.1002/ange.200805994
  66. 10.1002/anie.200805994
  67. 10.1016/j.micron.2004.02.003
  68. 10.1103/PhysRevLett.99.086102
  69. 10.1126/science.1175005
  70. 10.1109/TMAG.2008.924532
  71. 10.1021/jp9622748
  72. 10.1016/j.elspec.2007.08.002
  73. 10.1016/j.elspec.2008.10.008
  74. 10.1016/j.elspec.2008.01.002
  75. 10.1016/j.elspec.2009.01.004
Dates
Type When
Created 15 years, 5 months ago (March 20, 2010, 7:40 p.m.)
Deposited 1 year, 10 months ago (Oct. 10, 2023, 2:09 p.m.)
Indexed 1 month, 1 week ago (July 14, 2025, 11:30 p.m.)
Issued 15 years, 4 months ago (March 30, 2010)
Published 15 years, 4 months ago (March 30, 2010)
Published Online 15 years, 4 months ago (March 30, 2010)
Published Print 15 years, 4 months ago (April 6, 2010)
Funders 0

None

@article{de_Groot_2010, title={In‐situ Scanning Transmission X‐Ray Microscopy of Catalytic Solids and Related Nanomaterials}, volume={11}, ISSN={1439-7641}, url={http://dx.doi.org/10.1002/cphc.200901023}, DOI={10.1002/cphc.200901023}, number={5}, journal={ChemPhysChem}, publisher={Wiley}, author={de Groot, Frank M. F. and de Smit, Emiel and van Schooneveld, Matti M. and Aramburo, Luis R. and Weckhuysen, Bert M.}, year={2010}, month=mar, pages={951–962} }