Abstract
AbstractThe present status of in‐situ scanning transmission X‐ray microscopy (STXM) is reviewed, with an emphasis on the abilities of the STXM technique in comparison with electron microscopy. The experimental aspects and interpretation of X‐ray absorption spectroscopy (XAS) are briefly introduced and the experimental boundary conditions that determine the potential applications for in‐situ XAS and in‐situ STXM studies are discussed. Nanoscale chemical imaging of catalysts under working conditions is outlined using cobalt and iron Fischer–Tropsch catalysts as showcases. In the discussion, we critically compare STXM‐XAS and STEM‐EELS (scanning transmission electron microscopy–electron energy loss spectroscopy) measurements and indicate some future directions of in‐situ nanoscale imaging of catalytic solids and related nanomaterials.
References
75
Referenced
124
10.1002/ange.200900339
10.1002/anie.200900339
10.1038/nature04502
10.1016/S0368-2048(97)00013-3
10.1051/jp4:200300037
10.1063/1.3021472
10.1016/j.nima.2007.08.083
10.1107/S0909049597014283
10.1107/S0909049502005502
- F. de Groot XASEELS website www.anorg.chem.uu.nl/people/staff/FrankdeGroot/xaseels.htm.2010 3.
10.1016/S0167-5729(97)00011-3
10.1126/science.1439809
10.1021/jp0403846
10.1201/9781420008425
10.1021/ja00021a018
10.1016/j.ccr.2004.03.018
10.1021/ja061802i
10.1021/ja034634s
10.1021/jp034125c
10.1021/jp802915k
10.1016/j.elspec.2009.04.010
10.1016/0038-1098(94)90027-2
10.1063/1.1138464
10.1021/jp013281l
10.1021/la9804132
10.1016/j.carbon.2004.08.029
10.1038/nature03719
10.1107/S0909049502017739
{'key': 'e_1_2_8_28_2', 'volume-title': 'Principles and Applications of Zone Plate X‐Ray Microscopes in The Science of Microscopy', 'author': 'Howells M.', 'year': '2007'}
/ Principles and Applications of Zone Plate X‐Ray Microscopes in The Science of Microscopy by Howells M. (2007)10.1111/j.1472-4669.2009.00211.x
10.1016/S0168-9002(01)00517-4
10.1016/j.nima.2008.12.157
10.1016/S0360-0564(08)00004-7
10.1103/PhysRevLett.103.110801
10.1016/j.ultramic.2009.05.002
10.1016/j.ultramic.2008.04.014
10.1016/j.ultramic.2008.05.012
10.1051/mmm:1995115
10.1016/j.micron.2007.09.010
10.1016/S0368-2048(97)00016-9
10.1063/1.1150023
10.1088/0034-4885/57/9/002
10.1038/nature00972
10.1038/nmat2380
10.1126/science.1148820
-
M. P. Seah W. A. Dench Quantitative Electron Spectroscopy of Surfaces: A Standard Data Base for Electron Inelastic Mean Free Paths in Solids Surface and Interface Anal. 1 2 1979.
(
10.1002/sia.740010103
) 10.1364/OE.17.017669
{'key': 'e_1_2_8_47_2', 'first-page': '5', 'volume': '19', 'author': 'Chen Y. T.', 'year': '2008', 'journal-title': 'Nanotechnology'}
/ Nanotechnology by Chen Y. T. (2008)10.1016/j.cattod.2008.11.002
10.1002/ange.200703673
10.1002/anie.200703673
10.1021/ja907329j
10.1002/(SICI)1521-3757(19980703)110:13/14<2049::AID-ANGE2049>3.0.CO;2-H
10.1002/(SICI)1521-3773(19980803)37:13/14<1939::AID-ANIE1939>3.0.CO;2-T
10.1039/b306130m
10.1039/b920256k
10.1002/marc.200300178
10.1002/1521-4095(200012)12:23<1809::AID-ADMA1809>3.0.CO;2-B
10.1063/1.1791320
- I. Swart E. de Smit B. M. Weckhuysen F. M. F. de Groot unpublished results 2007.
10.1038/nature07516
10.1002/ange.200806003
10.1002/anie.200806003
10.1021/jp901528g
10.1002/ange.200805994
10.1002/anie.200805994
10.1016/j.micron.2004.02.003
10.1103/PhysRevLett.99.086102
10.1126/science.1175005
10.1109/TMAG.2008.924532
10.1021/jp9622748
10.1016/j.elspec.2007.08.002
10.1016/j.elspec.2008.10.008
10.1016/j.elspec.2008.01.002
10.1016/j.elspec.2009.01.004
Dates
Type | When |
---|---|
Created | 15 years, 5 months ago (March 20, 2010, 7:40 p.m.) |
Deposited | 1 year, 10 months ago (Oct. 10, 2023, 2:09 p.m.) |
Indexed | 1 month, 1 week ago (July 14, 2025, 11:30 p.m.) |
Issued | 15 years, 4 months ago (March 30, 2010) |
Published | 15 years, 4 months ago (March 30, 2010) |
Published Online | 15 years, 4 months ago (March 30, 2010) |
Published Print | 15 years, 4 months ago (April 6, 2010) |
@article{de_Groot_2010, title={In‐situ Scanning Transmission X‐Ray Microscopy of Catalytic Solids and Related Nanomaterials}, volume={11}, ISSN={1439-7641}, url={http://dx.doi.org/10.1002/cphc.200901023}, DOI={10.1002/cphc.200901023}, number={5}, journal={ChemPhysChem}, publisher={Wiley}, author={de Groot, Frank M. F. and de Smit, Emiel and van Schooneveld, Matti M. and Aramburo, Luis R. and Weckhuysen, Bert M.}, year={2010}, month=mar, pages={951–962} }