DOI: 10.1002/bbpc.19700741109. The Fourier Transform of an Electron Micrograph: Effects of Defocussing and Aberrations, and Implications for the Use of Underfocus Contrast Enhancement

The Fourier Transform of an Electron Micrograph: Effects of Defocussing and Aberrations, and Implications for the Use of Underfocus Contrast Enhancement

10.1002/bbpc.19700741109

Crossref journal-article

Wiley

Berichte der Bunsengesellschaft für physikalische Chemie (311)

Abstract

AbstractThe effects of defocussing and spherical aberration in the electron microscope image are most simply and directly displayed in the Fourier transform of the image. We have investigated the process of image formation by determining the changes in the transform of the image of thin crystals of catalase, which has discrete diffraction maxima in the resolution range of 100 Å to 20 Å, as a function of defocussing. The experimentally measured changes in amplitude and phase of these diffraction maxima have been measured and compared with the predictions of a first order theory of image formation. The theory is generally confirmed, and the transfer function of the microscope is completely determined by finding the relative contributions from phase and amplitude contrast. A “true” maximum contrast image of the catalase molecule, compensated for the effects of defocussing, is reconstructed from the set of micrographs in the focal series. The relation of this compensated image to individual underfocussed micrographs, and the use of underfocus contrast enhancement in conventional electron microscopy, is discussed.This approach and the experimental methods can be extended to high resolution in order to compensate for spherical aberration as well as defocussing, thereby offering the potential for extending the resolution of the microscope well beyond the presently attainable 5 Å.

Bibliography

Erickson, H. P., & Klug, A. (1970). The Fourier Transform of an Electron Micrograph: Effects of Defocussing and Aberrations, and Implications for the Use of Underfocus Contrast Enhancement. Berichte Der Bunsengesellschaft FÃ¼r Physikalische Chemie, 74(11), 1129â1137. Portico.

Authors 2

Harold P. Erickson (first)
A. Klug (additional)

References 9 Referenced 56

10.1088/0370-1328/79/4/301
{'key': 'e_1_2_1_3_1', 'volume-title': 'Electron Microscopy', 'author': 'van Dorsten A. C.', 'year': '1968'} / Electron Microscopy by van Dorsten A. C. (1968)
10.1038/217130a0
D. J.DeRosierandP.Moore J. Mol. Biol. (1970) (in press).
H.Erickson manuscript in preparation.
10.1242/jcs.2.4.587 / J. Cell. Sci. by Finch J. T. (1967)
10.1016/S0022-2836(68)80014-2
P.Schiske in: Electron Microscopy op. cit. (1968).
10.1515/zna-1966-0417 / Z. Naturforsch. by Thon F. (1966)

Dates

Type	When
Created	1 year, 9 months ago (Nov. 13, 2023, 8:59 p.m.)
Deposited	1 year, 9 months ago (Nov. 13, 2023, 9 p.m.)
Indexed	1 month, 1 week ago (July 24, 2025, 7:11 a.m.)
Issued	54 years, 9 months ago (Nov. 1, 1970)
Published	54 years, 9 months ago (Nov. 1, 1970)
Published Online	15 years, 3 months ago (May 4, 2010)
Published Print	54 years, 9 months ago (Nov. 1, 1970)

Funders 0

None

BibTeX

@article{Erickson_1970, title={The Fourier Transform of an Electron Micrograph: Effects of Defocussing and Aberrations, and Implications for the Use of Underfocus Contrast Enhancement}, volume={74}, ISSN={0005-9021}, url={http://dx.doi.org/10.1002/bbpc.19700741109}, DOI={10.1002/bbpc.19700741109}, number={11}, journal={Berichte der Bunsengesellschaft für physikalische Chemie}, publisher={Wiley}, author={Erickson, Harold P. and Klug, A.}, year={1970}, month=nov, pages={1129–1137} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        7,
        24
      ]
    ],
    "date-time": "2025-07-24T11:11:58Z",
    "timestamp": 1753355518560
  },
  "reference-count": 9,
  "publisher": "Wiley",
  "issue": "11",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2010,
            5,
            4
          ]
        ],
        "date-time": "2010-05-04T00:00:00Z",
        "timestamp": 1272931200000
      },
      "content-version": "vor",
      "delay-in-days": 14429,
      "URL": "http://onlinelibrary.wiley.com/termsAndConditions#vor"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1970,
        11
      ]
    ]
  },
  "abstract": "<jats:title>Abstract</jats:title><jats:p>The effects of defocussing and spherical aberration in the electron microscope image are most simply and directly displayed in the Fourier transform of the image. We have investigated the process of image formation by determining the changes in the transform of the image of thin crystals of catalase, which has discrete diffraction maxima in the resolution range of 100 \u00c5 to 20 \u00c5, as a function of defocussing. The experimentally measured changes in amplitude and phase of these diffraction maxima have been measured and compared with the predictions of a first order theory of image formation. The theory is generally confirmed, and the transfer function of the microscope is completely determined by finding the relative contributions from phase and amplitude contrast. A \u201ctrue\u201d maximum contrast image of the catalase molecule, compensated for the effects of defocussing, is reconstructed from the set of micrographs in the focal series. The relation of this compensated image to individual underfocussed micrographs, and the use of underfocus contrast enhancement in conventional electron microscopy, is discussed.</jats:p><jats:p>This approach and the experimental methods can be extended to high resolution in order to compensate for spherical aberration as well as defocussing, thereby offering the potential for extending the resolution of the microscope well beyond the presently attainable 5 \u00c5.</jats:p>",
  "DOI": "10.1002/bbpc.19700741109",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2023,
        11,
        14
      ]
    ],
    "date-time": "2023-11-14T01:59:09Z",
    "timestamp": 1699927149000
  },
  "page": "1129-1137",
  "source": "Crossref",
  "is-referenced-by-count": 56,
  "title": "The Fourier Transform of an Electron Micrograph: Effects of Defocussing and Aberrations, and Implications for the Use of Underfocus Contrast Enhancement",
  "prefix": "10.1002",
  "volume": "74",
  "author": [
    {
      "given": "Harold P.",
      "family": "Erickson",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "A.",
      "family": "Klug",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "311",
  "published-online": {
    "date-parts": [
      [
        2010,
        5,
        4
      ]
    ]
  },
  "reference": [
    {
      "key": "e_1_2_1_2_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0370-1328/79/4/301"
    },
    {
      "key": "e_1_2_1_3_1",
      "volume-title": "Electron Microscopy",
      "author": "van Dorsten A. C.",
      "year": "1968"
    },
    {
      "key": "e_1_2_1_4_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1038/217130a0"
    },
    {
      "key": "e_1_2_1_5_1",
      "unstructured": "D. J.DeRosierandP.Moore J. Mol. Biol. (1970) (in press)."
    },
    {
      "key": "e_1_2_1_6_1",
      "unstructured": "H.Erickson manuscript in preparation."
    },
    {
      "key": "e_1_2_1_7_1",
      "doi-asserted-by": "crossref",
      "first-page": "587",
      "DOI": "10.1242/jcs.2.4.587",
      "volume": "2",
      "author": "Finch J. T.",
      "year": "1967",
      "journal-title": "J. Cell. Sci."
    },
    {
      "key": "e_1_2_1_8_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0022-2836(68)80014-2"
    },
    {
      "key": "e_1_2_1_9_1",
      "unstructured": "P.Schiske in: Electron Microscopy op. cit. (1968)."
    },
    {
      "key": "e_1_2_1_10_1",
      "doi-asserted-by": "crossref",
      "first-page": "476",
      "DOI": "10.1515/zna-1966-0417",
      "volume": "21",
      "author": "Thon F.",
      "year": "1966",
      "journal-title": "Z. Naturforsch."
    }
  ],
  "container-title": "Berichte der Bunsengesellschaft f\u00fcr physikalische Chemie",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://onlinelibrary.wiley.com/doi/pdf/10.1002/bbpc.19700741109",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        11,
        14
      ]
    ],
    "date-time": "2023-11-14T02:00:51Z",
    "timestamp": 1699927251000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://onlinelibrary.wiley.com/doi/10.1002/bbpc.19700741109"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1970,
        11
      ]
    ]
  },
  "references-count": 9,
  "journal-issue": {
    "issue": "11",
    "published-print": {
      "date-parts": [
        [
          1970,
          11
        ]
      ]
    }
  },
  "alternative-id": [
    "10.1002/bbpc.19700741109"
  ],
  "URL": "http://dx.doi.org/10.1002/bbpc.19700741109",
  "relation": {},
  "ISSN": [
    "0005-9021",
    "0005-9021"
  ],
  "subject": [],
  "container-title-short": "Ber Bunsenges Phys Chem",
  "published": {
    "date-parts": [
      [
        1970,
        11
      ]
    ]
  }
}