Abstract
AbstractAll the poly(olefin sulfones) examined degraded rapidly under electron irradiation. The dose required to effect a molecular weight distribution completely separated from the original distribution as required for fractional solution development was similar for all polymers, viz., 1–2 × 10−6 coulomb/cm2. This indicates that they all have similar values for G(scission). The film thickness of the exposed area decreased at a rate dependent on olefin structure and temperature. This process, termed vapor development, has been attributed to concurrent chain scission and depolymerization. Factors determining the rate of depropagation are discussed.
References
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Dates
Type | When |
---|---|
Created | 22 years, 4 months ago (April 14, 2003, 6:05 p.m.) |
Deposited | 1 year, 11 months ago (Oct. 1, 2023, 4:12 p.m.) |
Indexed | 1 week, 5 days ago (Aug. 21, 2025, 1:26 p.m.) |
Issued | 51 years, 11 months ago (Oct. 1, 1973) |
Published | 51 years, 11 months ago (Oct. 1, 1973) |
Published Online | 22 years, 5 months ago (March 9, 2003) |
Published Print | 51 years, 11 months ago (Oct. 1, 1973) |
@article{Bowden_1973, title={Electron irradiation of poly(olefin sulfones). Application to electron beam resists}, volume={17}, ISSN={1097-4628}, url={http://dx.doi.org/10.1002/app.1973.070171022}, DOI={10.1002/app.1973.070171022}, number={10}, journal={Journal of Applied Polymer Science}, publisher={Wiley}, author={Bowden, M. J. and Thompson, L. F.}, year={1973}, month=oct, pages={3211–3221} }