DOI: 10.1002/adom.201900239. Thickness‐Dependent Refractive Index of 1L, 2L, and 3L MoS2, MoSe2, WS2, and WSe2

Thickness‐Dependent Refractive Index of 1L, 2L, and 3L MoS2, MoSe2, WS2, and WSe2

10.1002/adom.201900239

Crossref journal-article

Wiley

Advanced Optical Materials (311)

Abstract

AbstractAn interesting aspect of 2D materials is the change of their electronic structure with the reduction of thickness. Molybdenum and tungsten‐based transition metal dichalcogenides form an important family of 2D materials, whose members show a thickness‐dependent bandgap and strong light–matter interaction. In this work, the experimental determination of the complex refractive index of 1‐, 2‐, 3‐layer thick MoS2, MoSe2, WS2, and WSe2 in the range from 400 to 850 nm of the electromagnetic spectrum is reported by using microreflectance spectroscopy and combined with calculations based on the Fresnel equations. It is further provided a comparison with the bulk refractive index values reported in the literature and a discussion of the difference/similarity between our work and the monolayer refractive index available from the literature, finding that the results from different techniques are in good agreement.

Bibliography

Hsu, C., Frisenda, R., Schmidt, R., Arora, A., de Vasconcellos, S. M., Bratschitsch, R., van der Zant, H. S. J., & CastellanosâGomez, A. (2019). ThicknessâDependent Refractive Index of 1L, 2L, and 3L MoS2, MoSe2, WS2, and WSe2. Advanced Optical Materials, 7(13). Portico.

Authors 8

Chunwei Hsu (first)
Riccardo Frisenda (additional)
Robert Schmidt (additional)
Ashish Arora (additional)
Steffen Michaelis de Vasconcellos (additional)
Rudolf Bratschitsch (additional)
Herre S. J. van der Zant (additional)
Andres Castellanos‐Gomez (additional)

References 29 Referenced 204

10.1038/nnano.2012.193
10.1038/nnano.2013.277
10.1103/PhysRevLett.105.136805
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10.1063/1.4868108
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{'key': 'e_1_2_5_11_1', 'first-page': '1', 'volume': '90', 'author': 'Li W.', 'year': '2014', 'journal-title': 'Phys. Rev. B'} / Phys. Rev. B by Li W. (2014)
10.1038/srep08440
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10.1088/1361-6463/aa5256
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{'key': 'e_1_2_5_21_1', 'first-page': '791', 'volume': '7', 'author': 'Zhao W.', 'year': '2013', 'journal-title': 'Nano'} / Nano by Zhao W. (2013)
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Dates

Type	When
Created	6 years, 3 months ago (May 6, 2019, 4:36 p.m.)
Deposited	1 year, 11 months ago (Sept. 10, 2023, 3:12 a.m.)
Indexed	1 week ago (Aug. 29, 2025, 6:12 a.m.)
Issued	6 years, 3 months ago (May 6, 2019)
Published	6 years, 3 months ago (May 6, 2019)
Published Online	6 years, 3 months ago (May 6, 2019)
Published Print	6 years, 2 months ago (July 1, 2019)

Funders 1

Nederlandse Organisatie voor Wetenschappelijk Onderzoek 10.13039/501100003246
Region: Europe
gov (National government)
Labels9
1. Netherlands Organisation for Scientific Research
2. Dutch National Scientific Foundation
3. Dutch National Science Foundation
4. Dutch Research Council (Nederlandse Organisatie voor Wetenschappelijk Onderzoek)
5. NWO:Nederlandse Organisatie voor Wetenschappelijk Onderzoek
6. Nederlandse Organisatie voor Wetenschappelijk Onderzoek (NWO)
7. Dutch Research Council
8. Dutch Research Council, Netherlands
9. NWO
Awards1
1. 680‐50‐1515

BibTeX

@article{Hsu_2019, title={Thickness‐Dependent Refractive Index of 1L, 2L, and 3L MoS2, MoSe2, WS2, and WSe2}, volume={7}, ISSN={2195-1071}, url={http://dx.doi.org/10.1002/adom.201900239}, DOI={10.1002/adom.201900239}, number={13}, journal={Advanced Optical Materials}, publisher={Wiley}, author={Hsu, Chunwei and Frisenda, Riccardo and Schmidt, Robert and Arora, Ashish and de Vasconcellos, Steffen Michaelis and Bratschitsch, Rudolf and van der Zant, Herre S. J. and Castellanos‐Gomez, Andres}, year={2019}, month=may }

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