Crossref journal-article
Wiley
Advanced Materials (311)
Bibliography

Ellison, D. J., Lee, B., Podzorov, V., & Frisbie, C. D. (2010). Surface Potential Mapping of SAM‐Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy. Advanced Materials, 23(4), 502–507. Portico.

Dates
Type When
Created 14 years, 8 months ago (Dec. 6, 2010, 3:11 a.m.)
Deposited 1 year, 10 months ago (Oct. 11, 2023, 4:16 p.m.)
Indexed 3 months ago (May 23, 2025, 1:03 a.m.)
Issued 14 years, 8 months ago (Dec. 6, 2010)
Published 14 years, 8 months ago (Dec. 6, 2010)
Published Online 14 years, 8 months ago (Dec. 6, 2010)
Published Print 14 years, 6 months ago (Jan. 25, 2011)
Funders 0

None

@article{Ellison_2010, title={Surface Potential Mapping of SAM‐Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy}, volume={23}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.201003122}, DOI={10.1002/adma.201003122}, number={4}, journal={Advanced Materials}, publisher={Wiley}, author={Ellison, David J. and Lee, Bumsu and Podzorov, V. and Frisbie, C. Daniel}, year={2010}, month=dec, pages={502–507} }